Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for measuring a structure on a substrate

Method and apparatus for measuring a structure on a substrate

US Patent 10788765 · Granted Sep 29, 2020

Estimated economic value: $30,610,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Wavefront metrology sensor and mask therefor, method for optimizing a mask and a2025
Determining relationships between nodes within connected graphs2025
Image processing system, cloud serving end, and method2025
Metrology apparatus based on high harmonic generation and associated method2025
Face recognition method, apparatus, electronic device, and storage medium2025
Method and apparatus for generating strategy of object transport-and-pack proces2025
Optical displaying system, displaying device and method for controlling optical 2025
Kalmannet: a learnable Kalman filter for acoustic echo cancellation2025
Interconnected electrode structure having multi-conductive through hole and meth2025
Method for determining vacuum degree threshold, and medium, and electronic devic2025
Near-eye display device2025
Display apparatus having flexible panel and shielded multiplexer in non-display 2025