Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11042096 | Alignment measurement system | Stefan Michiel Witte, Alessandro Antoncecchi, Hao Zhang, Stephen EDWARD, Sebastianus Adrianus GOORDEN +3 more | 2021-06-22 |
| 10788765 | Method and apparatus for measuring a structure on a substrate | Stefan Michiel Witte, Alessandro Antoncecchi, Stephen EDWARD, Hao Zhang, Kjeld Sijbrand Eduard Eikema +3 more | 2020-09-29 |