LJ

Lawrence Jacobs

Oracle: 20 patents #433 of 14,854Top 3%
LE Lecroy: 14 patents #3 of 77Top 4%
TL Teledyne Lecroy: 1 patents #24 of 58Top 45%
Overall (All Time): #87,887 of 4,157,543Top 3%
37
Patents All Time

Issued Patents All Time

Showing 25 most recent of 37 patents

Patent #TitleCo-InventorsDate
12228607 Temperature compensation of optically isolated probe Matthew Weinstein, Francois Lamarche 2025-02-18
10768211 System and method for current sense resistor compensation Peter J. Pupalaikis, Istvan Novak 2020-09-08
10551417 Inductor current measurement probe Istvan Novak, Peter J. Pupalaikis 2020-02-04
8170820 Virtual probing Peter J. Pupalaikis, Stephen Mark Sekel 2012-05-01
7865319 Fixture de-embedding method and system for removing test fixture characteristics when calibrating measurement systems Peter J. Pupalaikis 2011-01-04
7849116 System and method for automated layout of collaboratively selected images Shehzaad Nakhoda, Xiang Liu, Tie Zhong, Fredric Goell 2010-12-07
7660685 Virtual probing Peter J. Pupalaikis, Stephen Mark Sekel 2010-02-09
7600230 System and method for managing security meta-data in a reverse proxy Ajay M. Desai, Ming Lei, Fredric Goell 2009-10-06
7525328 Cap at resistors of electrical test probe Julie A. Campbell 2009-04-28
7509404 Methods and systems for partial page caching of dynamically generated content Alok Agrawal, Ramkumar Venketaramani, Leslie Bruce Lowenthal, Xiang Liu, Shehzaad Nakhoda +2 more 2009-03-24
7437754 Web object access authorization protocol based on an HTTP validation model Ajay M. Desai, Ming Lei, Ric Goell 2008-10-14
7432698 Modular active test probe and removable tip module therefor Julie A. Campbell, Stephen Mark Sekel 2008-10-07
7378832 Probing high-frequency signals Albert Sutono, Julie A. Campbell, Yigal Shaul 2008-05-27
7321919 System and method for collaborative image selection Shehzaad Nakhoda, Xiang Liu, Tie Zhong 2008-01-22
7321234 Resistive test probe tips and applications therefor Julie A. Campbell 2008-01-22
7299300 System and method for dynamically selecting a level of compression for data to be transmitted Sachin Desai, Probal Nandy 2007-11-20
7295020 Cap at resistors of electrical test probe Julie A. Campbell 2007-11-13
7202678 Resistive probe tips Julie A. Campbell 2007-04-10
7143244 System and method for invalidating data in a hierarchy of caches Shu Ling, Xiang Liu, Fredric Goell 2006-11-28
7103714 System and method for serving one set of cached data for differing data requests Xiang Liu, Shehzaad Nakhoda, Rajiv Mishra, Zheng Zeng, Sachin Desai 2006-09-05
7089363 System and method for inline invalidation of cached data Shu Ling, Xiang Liu, Fredric Goell, Tie Zhong, Xiaoli Qi 2006-08-08
7076608 Invalidating cached data using secondary keys Senthilnathan Arunagirinathan, Zheng Zeng, Yuhui Zhu, Shu Ling, Fredric Goell +1 more 2006-07-11
7042232 Cable and substrate compensating custom resistor 2006-05-09
7019544 Transmission line input structure test probe Julie A. Campbell 2006-03-28
6973536 Self-adaptive hybrid cache Xiang Liu, Marcin Porwit, James Feenan, William Wright 2005-12-06