Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Fixture de-embedding method and system for removing test fixture characteristics when calibrating measurement systems

Fixture de-embedding method and system for removing test fixture characteristics when calibrating measurement systems

US Patent 7865319 · Granted Jan 4, 2011

Estimated economic value: $2,110,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Data processing systems including optical communication modules2025
Optical fiber-to-chip interconnection2025
Communication systems having pluggable modules2025
Communication systems having co-packaged optical modules2025
Communication systems having pluggable modules2025
Data processing systems including optical communication modules2025
Data processing systems including optical communication modules2025
Temperature compensation of optically isolated probe2025
Communication systems having co-packaged optical modules2024
Data processing systems including optical communication modules2024
Communication systems having pluggable modules2024
Data processing systems including optical communication modules2024