JC

Julie A. Campbell

LE Lecroy: 30 patents #1 of 77Top 2%
Tektronix: 19 patents #33 of 1,698Top 2%
TL Teledyne Lecroy: 3 patents #8 of 58Top 15%
ME Merial: 1 patents #200 of 414Top 50%
BO BOE: 1 patents #7,844 of 12,373Top 65%
📍 Beaverton, OR: #88 of 3,140 inventorsTop 3%
🗺 Oregon: #603 of 28,073 inventorsTop 3%
Overall (All Time): #47,019 of 4,157,543Top 2%
54
Patents All Time

Issued Patents All Time

Showing 1–25 of 54 patents

Patent #TitleCo-InventorsDate
12332277 Thermal management system for a test-and-measurement probe Matthew J. Hull, David Thomas Engquist 2025-06-17
12055578 Securing a probe to a device under test 2024-08-06
11815548 Test and measurement instrument accessory with reconfigurable processing component Charles W. Case, Jr., Daniel G. Knierim, Joshua J. O'Brien, Josiah A. Bartlett 2023-11-14
11808786 Precision, high bandwidth, switching attenuator Daniel G. Knierim, Barton T. Hickman 2023-11-07
11578925 Thermal management system for a test-and-measurement probe David Thomas Engquist, Sam J. Strickling 2023-02-14
11385258 Encapsulated component attachment technique using a UV-cure conductive adhesive Karl A. Rinder, Regina R. Mrozik 2022-07-12
11079408 Resistive test-probe tips Josiah A. Bartlett 2021-08-03
10962566 Position sensing in a probe to modify transfer characteristics in a system Josiah A. Bartlett, David A. Sailor, Jay Schwichtenberg 2021-03-30
10859598 Back-drilled via attachment technique using a UV-cure conductive adhesive Karl A. Rinder, Daniel G. Knierim 2020-12-08
10845384 Surface-mountable apparatus for coupling a test and measurement instrument to a device under test 2020-11-24
10739381 Component attachment technique using a UV-cure conductive adhesive Regina R. Mrozik 2020-08-11
10507545 Laser ablation machine for labeling cryogenically-frozen vials Andy Brehm, Dennis Jerome Freeman, Ed Schindler 2019-12-17
10241133 Probe tip and probe assembly William A. Hagerup, Ira G. Pollock, Christina D. Enns, James E. Spinar, Kathleen F. M. Ullom +2 more 2019-03-26
10215776 Position sensing in a probe to modify transfer characteristics in a system Josiah A. Bartlett, David A. Sailor, Jay Schwichtenberg 2019-02-26
10168356 Test and measurement probe with adjustable test point contact William A. Hagerup, Ira G. Pollock 2019-01-01
10119992 High impedance compliant probe tip William A. Hagerup, Ira G. Pollock, James E. Spinar, Kathleen F. M. Ullom, Charles M. Hartmann +2 more 2018-11-06
10071582 Apparatus and methods for labeling vials or ampoules stored at temperatures as low as -200° C Andy Brehm, Ed Schindler, Dennis Jerome Freeman 2018-09-11
9810715 High impedance compliant probe tip Ira G. Pollock, William A. Hagerup, Christina D. Enns 2017-11-07
D786108 Browser probe assembly 2017-05-09
9404940 Compensating probing tip optimized adapters for use with specific electrical test probes Lenny Rayzman, Albert Sutono 2016-08-02
9140724 Compensating resistance probing tip optimized adapters for use with specific electrical test probes 2015-09-22
8786299 Adherable holder and locater tool 2014-07-22
8421488 Adherable holder and locater tool Bruce C. Tollbom 2013-04-16
8134377 Adherable holder and locater tool Bruce C. Tollbom 2012-03-13
8098078 Probing blade with conductive connector for use with an electrical test probe 2012-01-17