JB

Josiah A. Bartlett

Tektronix: 21 patents #26 of 1,698Top 2%
Overall (All Time): #187,817 of 4,157,543Top 5%
22
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12372550 Isolated probe tip Daniel G. Knierim, Andrew W. Rusinek, David Thomas Engquist 2025-07-29
12235291 Current shunt probe Daniel G. Knierim 2025-02-25
12210039 Multi-mode measurement probe Joshua J. O'Brien 2025-01-28
12038456 Multi-user test instrument 2024-07-16
11815548 Test and measurement instrument accessory with reconfigurable processing component Charles W. Case, Jr., Daniel G. Knierim, Joshua J. O'Brien, Julie A. Campbell 2023-11-14
11733271 Multi-segmented Rogowski-coil current sensor 2023-08-22
11719721 Test and measurement probe having a touchscreen Karl A. Rinder, David A. Sailor 2023-08-08
11619657 Frequency converter accessory for a test and measurement instrument Daniel G. Knierim, Amr Haj-Omar, Donald J. Dalebroux, Barton T. Hickman, Alexander Krauska 2023-04-04
11079408 Resistive test-probe tips Julie A. Campbell 2021-08-03
11041880 Contactless coupling between test and measurement system and a device under test 2021-06-22
10962566 Position sensing in a probe to modify transfer characteristics in a system Julie A. Campbell, David A. Sailor, Jay Schwichtenberg 2021-03-30
10215776 Position sensing in a probe to modify transfer characteristics in a system Julie A. Campbell, David A. Sailor, Jay Schwichtenberg 2019-02-26
9581675 Virtual model adapter removal and substitution technique for cascaded networks Laudie J. Doubrava 2017-02-28
8810258 Signal acquisition system having reduced probe loading of a device under test Ira G. Pollock, Daniel G. Knierim, Michael Duane Stevens 2014-08-19
8791706 Signal acquisition system having a compensation digital filter Ira G. Pollock, Daniel G. Knierim, Michael Duane Stevens 2014-07-29
8723530 Signal acquisition system having reduced probe loading of a device under test Ira G. Pollock, Daniel G. Knierim, Lester L. Larson, Scott Jansen, Kenneth P. Dobyns +1 more 2014-05-13
8611436 Wideband balun structure Daniel G. Knierim, James S. Lamb 2013-12-17
8564308 Signal acquisition system having reduced probe loading of a device under test Ira G. Pollock, Daniel G. Knierim, Lester L. Larson, Scott Jansen, Kenneth P. Dobyns +1 more 2013-10-22
8456173 Signal acquisition system having probe cable termination in a signal processing instrument Daniel G. Knierim, Ira G. Pollock, Lester L. Larson 2013-06-04
8436624 Signal acquisition system having reduced probe loading of a device under test Ira G. Pollock, Daniel G. Knierim, Lester L. Larson, Scott Jansen, Kenneth P. Dobyns +1 more 2013-05-07
8278940 Signal acquisition system having a compensation digital filter Ira G. Pollock, Daniel G. Knierim, Lester L. Larson, Scott Jansen, Kenneth P. Dobyns 2012-10-02
8024141 Test and measurement instrument and method for providing post-acquisition trigger control and presentation Kristie Veith, Steven K. Sullivan 2011-09-20