DE

David Thomas Engquist

Tektronix: 13 patents #60 of 1,698Top 4%
Overall (All Time): #334,554 of 4,157,543Top 9%
14
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12372550 Isolated probe tip Daniel G. Knierim, Josiah A. Bartlett, Andrew W. Rusinek 2025-07-29
12332277 Thermal management system for a test-and-measurement probe Matthew J. Hull, Julie A. Campbell 2025-06-17
D992437 Tip cable component of a measurement probe head assembly Heather J. Vermilyea, Karl A. Rinder, Michael J. Mende, Tony Lee Tarr 2023-07-18
11578925 Thermal management system for a test-and-measurement probe Julie A. Campbell, Sam J. Strickling 2023-02-14
D947693 Measurement probe head assembly Heather J. Vermilyea, Karl A. Rinder, Michael J. Mende, Tony Lee Tarr 2022-04-05
10753961 Shielded probe tip interface Michael J. Mende, Richard A. Booman 2020-08-25
10228390 Cable assembly with spine for instrument probe James H. McGrath, Jr. 2019-03-12
D808832 Measurement system with controller and sensor head Tony Lee Tarr, Samuel M. Romey 2018-01-30
9007083 Self-retaining via probe Brian S. Mantel 2015-04-14
8598466 Controlled-impedance electronic board vias, method of forming the same, and unitized PCB incorporating the same Brian S. Mantel 2013-12-03
6888361 High density logic analyzer probing system 2005-05-03
6857898 Apparatus and method for low-profile mounting of a multi-conductor coaxial cable launch to an electronic circuit board J. Steve Lyford, Devin Bingham 2005-02-22
D444084 Modular measurement instrument Jerry L. Wrisley, James H. McGrath, Jr., Steve U. Reinhold 2001-06-26
D444086 Modular measurement instrument Jerry L. Wrisley, James H. McGrath, Jr., Steve U. Reinhold 2001-06-26