Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Transmission line input structure test probe

Transmission line input structure test probe

US Patent 7019544 · Granted Mar 28, 2006

Estimated economic value: $1,611,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Precision, high bandwidth, switching attenuator2025
Thermal management system for a test-and-measurement probe2025
Temperature compensation of optically isolated probe2025
Securing a probe to a device under test2024
Test and measurement instrument accessory with reconfigurable processing compone2023
Precision, high bandwidth, switching attenuator2023
Thermal management system for a test-and-measurement probe2023
Encapsulated component attachment technique using a UV-cure conductive adhesive2022
Resistive test-probe tips2021
Position sensing in a probe to modify transfer characteristics in a system2021
Back-drilled via attachment technique using a UV-cure conductive adhesive2020
Surface-mountable apparatus for coupling a test and measurement instrument to a 2020