KI

Kazutoshi Inoue

OC Oki Electric Industry Co.: 8 patents #196 of 2,807Top 7%
SI Super Silicon Crystal Research Institute: 4 patents #4 of 32Top 15%
LC Lapis Semiconductor Co.: 3 patents #73 of 349Top 25%
SO Sony: 2 patents #12,963 of 25,231Top 55%
OC Oki Semiconductor Co.: 1 patents #202 of 526Top 40%
SU Sumco: 1 patents #248 of 464Top 55%
TO Toyota: 1 patents #15,335 of 26,838Top 60%
MM Mitsubishi Materials: 1 patents #812 of 1,543Top 55%
MK Mitsui Kensetsu Kabushiki Kaisha: 1 patents #14 of 27Top 55%
ME Moore Epitaxial: 1 patents #6 of 9Top 70%
Overall (All Time): #167,006 of 4,157,543Top 5%
24
Patents All Time

Issued Patents All Time

Showing 1–24 of 24 patents

Patent #TitleCo-InventorsDate
12221086 Power supply system 2025-02-11
9453881 Oscillation circuit, integrated circuit, and abnormality detection method Katsutoshi Yoshimura 2016-09-27
9128831 Electrical device and method of setting address Yoshikatsu Matsuo 2015-09-08
8836341 Semiconductor circuit, semiconductor device, method of diagnosing abnormality of wire, and computer readable storage medium 2014-09-16
8412902 Signal processor and signal processing system 2013-04-02
7820554 Method for unloading thermally treated non-planar silicon wafers with a conveying blade Naoyuki Wada 2010-10-26
7315970 Semiconductor device to improve data retention characteristics of DRAM Tomofumi Arakawa, Hiroaki Kodama 2008-01-01
7230861 Semiconductor integrated circuit 2007-06-12
7058842 Microcontroller with multiple function blocks and clock signal control 2006-06-06
6967397 Test circuit and multi-chip package type semiconductor device having the test circuit Mitsuya Ohie 2005-11-22
6897554 Test circuit and multi-chip package type semiconductor device having the test circuit Mitsuya Ohie 2005-05-24
6885094 Test circuit and multi-chip package type semiconductor device having the test circuit Mitsuya Ohie 2005-04-26
6885095 Test circuit and multi-chip package type semiconductor device having the test circuit Mitsuya Ohie 2005-04-26
6863735 Epitaxial growth furnace Shinji Nakahara, Masato Imai, Masanori Mayusumi, Shintoshi Gima 2005-03-08
6762486 Test circuit and multi-chip package type semiconductor device having the test circuit Mitsuya Ohie 2004-07-13
6578589 Apparatus for manufacturing semiconductor wafer Masanori Mayusumi, Masato Imai, Shinji Nakahara, Shintoshi Gima 2003-06-17
6323140 Method of manufacturing semiconductor wafer Masanori Mayusumi, Masato Imai, Shinji Nakahara 2001-11-27
6262393 Epitaxial growth furnace Masato Imai, Masanori Mayusumi, Shinji Nakahara 2001-07-17
6245152 Method and apparatus for producing epitaxial wafer Masato Imai, Masanori Mayusumi, Shinji Nakahara 2001-06-12
6229369 Clock control circuit Atsushi Yusa, Mitsuya Ohie 2001-05-08
6163015 Substrate support element Gary M. Moore, Katsuhito Nishikawa 2000-12-19
5936448 Integrated circuit having independently testable input-output circuits and test method therefor Mitsuya Ohie, Toshihide Nagatome 1999-08-10
5585574 Shaft having a magnetostrictive torque sensor and a method for making same Tadashi Sugihara, Kazushi Yoshida, Ji-bin Yang, Isao Suzuki 1996-12-17
4618298 Method for constructing an enlarged tunnel and apparatus for forming the same Shigeo Takamiya, Kenzo Tsutaya 1986-10-21