Issued Patents All Time
Showing 1–25 of 25 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8745420 | Semiconductor device for supplying power supply voltage to semiconductor device | Kyotaro Nakamura, Shuichi Hashidate | 2014-06-03 |
| 8407491 | Semiconductor device for supplying power supply voltage to semiconductor device | Kyotaro Nakamura, Shuichi Hashidate | 2013-03-26 |
| 7761727 | Micro-controller having USB control unit, MC unit and oscillating circuit commonly used by the USB control unit and the MC unit | Kyotaro Nakamura, Shuichi Hashidate | 2010-07-20 |
| 7664969 | Semiconductor device for supplying external power supply voltages to three circuit blocks including USB controller and I/O block | Kyotaro Nakamura, Shuichi Hashidate | 2010-02-16 |
| 7414320 | Semiconductor device and method of manufacturing same | — | 2008-08-19 |
| 7409573 | Micro-controller having USB control unit, MC unit and oscillating circuit commonly used by the USB control unit and the MC unit | Kyotaro Nakamura, Shuichi Hashidate | 2008-08-05 |
| 6971032 | Supplying multiple voltages via three power supply terminals to a semiconductor device that is connectable to a host device and a peripheral device | Kyotaro Nakamura, Shuichi Hashidate | 2005-11-29 |
| 6967397 | Test circuit and multi-chip package type semiconductor device having the test circuit | Kazutoshi Inoue | 2005-11-22 |
| 6938108 | Micro-controller having USB control unit, MC unit and oscillating circuit commonly used by the USB control unit and the MC unit | Kyotaro Nakamura, Shuichi Hashidate | 2005-08-30 |
| 6905913 | Semiconductor device and method of manufacturing same | — | 2005-06-14 |
| 6897554 | Test circuit and multi-chip package type semiconductor device having the test circuit | Kazutoshi Inoue | 2005-05-24 |
| 6885095 | Test circuit and multi-chip package type semiconductor device having the test circuit | Kazutoshi Inoue | 2005-04-26 |
| 6885094 | Test circuit and multi-chip package type semiconductor device having the test circuit | Kazutoshi Inoue | 2005-04-26 |
| 6777801 | Semiconductor device and method of manufacturing same | — | 2004-08-17 |
| 6762486 | Test circuit and multi-chip package type semiconductor device having the test circuit | Kazutoshi Inoue | 2004-07-13 |
| 6580164 | Semiconductor device and method of manufacturing same | — | 2003-06-17 |
| 6445700 | Serial communication circuit | Atsushi Yusa | 2002-09-03 |
| 6249152 | Data storage control circuit | Hiroyuki Tanaka | 2001-06-19 |
| 6229369 | Clock control circuit | Atsushi Yusa, Kazutoshi Inoue | 2001-05-08 |
| 5936448 | Integrated circuit having independently testable input-output circuits and test method therefor | Kazutoshi Inoue, Toshihide Nagatome | 1999-08-10 |
| 5815105 | Analog-to-digital converter with writable result register | — | 1998-09-29 |
| 5581556 | Local area network system | — | 1996-12-03 |
| 5481214 | Voltage to pulse-width conversion circuit | Takashi Tamaki | 1996-01-02 |
| 5451952 | CMOS flash analog-to-digital converter with hysteresis | Seiichi Yamazaki, Yasuhiro Shin | 1995-09-19 |
| 5410269 | Sample-and-hold circuit | Hisashi Nakamura | 1995-04-25 |