Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10859507 | Surface defect inspection method and surface defect inspection apparatus | Takahiro Koshihara, Yoshiyuki Umegaki | 2020-12-08 |
| 9594191 | Solar reflector plate | Kazumichi Sashi, Shin Ishikawa, Yoshihito Sakamoto, Takahiro Kubota | 2017-03-14 |
| 9234680 | Solar light reflecting plate and light collecting/heat collecting device | Kazumichi Sashi, Naoki Nishiyama, Yoshihito Sakamoto | 2016-01-12 |
| 7599052 | Method for marking defect and device therefor | Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Hiroyuki Sugiura +11 more | 2009-10-06 |
| 7423744 | Method for marking defect and device therefor | Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Hiroyuki Sugiura +11 more | 2008-09-09 |
| 7248366 | Method for marking defect and device therefor | Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Hiroyuki Sugiura +11 more | 2007-07-24 |
| 5835220 | Method and apparatus for detecting surface flaws | Akira Kazama, Tsutomu Kawamura, Yuji Matoba | 1998-11-10 |
| 5438415 | Ellipsometer and method of controlling coating thickness therewith | Akira Kazama, Yoshiro Yamada, Takeo Yamada, Takeshi Yamazaki, Takamitsu TAKAYAMA +1 more | 1995-08-01 |
| 5335066 | Measuring method for ellipsometric parameter and ellipsometer | Takeo Yamada, Akira Kazama | 1994-08-02 |
| 5311285 | Measuring method for ellipsometric parameter and ellipsometer | Takeo Yamada, Akira Kazama | 1994-05-10 |