Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7599052 | Method for marking defect and device therefor | Mitsuaki Uesugi, Shoji Yoshikawa, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura +11 more | 2009-10-06 |
| 7423744 | Method for marking defect and device therefor | Mitsuaki Uesugi, Shoji Yoshikawa, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura +11 more | 2008-09-09 |
| 7248366 | Method for marking defect and device therefor | Mitsuaki Uesugi, Shoji Yoshikawa, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura +11 more | 2007-07-24 |
| 5104227 | Apparatus for measuring three-dimensional curved surface shapes | Mitsuaki Uesugi | 1992-04-14 |
| 5102224 | Apparatus for measuring three-dimensional curved surface shapes | Mitsuaki Uesugi | 1992-04-07 |
| 5102223 | Method and apparatus for measuring a three-dimensional curved surface shape | Mitsuaki Uesugi, Isamu Komine | 1992-04-07 |
| 4881126 | Image composing apparatus | Mitsuaki Uesugi, Isamu Komine | 1989-11-14 |
| 4874955 | Method and apparatus for measuring a three-dimensional curved surface shape | Mitsuaki Uesugi, Isamu Komine | 1989-10-17 |
| 4716459 | Fatigue crack position detection apparatus | Eiichi Makabe, Mitsuaki Uesugi, Kyusuke Maruyama, Kenji Iwai, Kazuo Sano | 1987-12-29 |