KS

Kazuo Sano

Canon: 3 patents #11,241 of 19,416Top 60%
NC Nippon Kokan Co.: 3 patents #85 of 735Top 15%
SH Shimadzu: 2 patents #805 of 2,007Top 45%
DC Dainichiseika Color & Chemicals Mfg. Co.: 2 patents #125 of 376Top 35%
JI Japan Atomic Energy Research Institute: 2 patents #81 of 609Top 15%
NC Nkk Co.: 1 patents #579 of 1,173Top 50%
WU Wakayama University: 1 patents #3 of 13Top 25%
IJ Ishikawajima-Harima Jukogyo: 1 patents #170 of 494Top 35%
MC Mishima Kosan Co.: 1 patents #4 of 33Top 15%
NK Nippon Kogaku K.K.: 1 patents #221 of 382Top 60%
Overall (All Time): #296,340 of 4,157,543Top 8%
16
Patents All Time

Issued Patents All Time

Showing 1–16 of 16 patents

Patent #TitleCo-InventorsDate
9855654 Power assist robot apparatus and control method therefor Eiichi Yagi, Motonobu Sato 2018-01-02
7148900 CCM calculating system, CCM calculating method and recording medium Fumiyoshi Saito, Osamu Kobayashi 2006-12-12
7148948 Scanning exposure apparatus, and device manufacturing method 2006-12-12
7027186 Method for evaluating reproducibility of toning sample by CCM Fumiyoshi Saito, Yasaku Watanabe, Eiko Fujiyama 2006-04-11
6891615 Conical diffraction grazing incidence spectrometer and diffraction grating for use in the spectrometer Masato Koike, Yoshihisa Harada 2005-05-10
6844973 Plane diffraction grating based on surface normal rotation and its application to an optical system Masato Koike, Yoshihisa Harada 2005-01-18
6577381 Projection exposure apparatus, and device manufacturing method using the same 2003-06-10
6323937 Projection exposure apparatus, and device manufacturing method using the same 2001-11-27
5740079 Method for determining colorimetric value Yoshihiro Shigemori, Tomio Saito, Fumiyoshi Saito, Tomiko Yoshida 1998-04-14
5363238 Diffraction grating Yasuhiro Akune, Kichiya Tanino, Masaru Koeda, Tetsuya Nagano, Eiji Ishiguro 1994-11-08
5293922 Process for manufacturing gas flow unit Kiwamu Imai, Masami Sayama, Kazuyuki Higashino, Yasunori Omori, Hoshiro Tani +1 more 1994-03-15
4850711 Film thickness-measuring apparatus using linearly polarized light Takao Miyazaki, Yoshiro Yamada 1989-07-25
4848912 Apparatus for measuring a shape Mitsuaki Uesugi, Masami Harayama, Yoshihiro Okuno, Hiroshi Matsunaga, Yoichi Matsuju 1989-07-18
4716459 Fatigue crack position detection apparatus Eiichi Makabe, Mitsuaki Uesugi, Masaichi Inomata, Kyusuke Maruyama, Kenji Iwai 1987-12-29
4380393 Grazing incidence spectrometer Hiroshi Nagata, Jiro Morimoto, Makoto Shiho 1983-04-19
4309902 Method for continuously measuring steepness of defective flatness of metal strip during rolling Katsujiro Watanabe, Seigo Ando 1982-01-12