SA

Seigo Ando

NT NTT: 9 patents #571 of 4,871Top 15%
NE Ntt Electronics: 8 patents #13 of 358Top 4%
NC Nippon Kokan Co.: 7 patents #18 of 735Top 3%
NC Nkk Co.: 6 patents #79 of 1,173Top 7%
Pioneer Electronic: 1 patents #1,093 of 1,840Top 60%
Overall (All Time): #164,621 of 4,157,543Top 4%
25
Patents All Time

Issued Patents All Time

Showing 1–25 of 25 patents

Patent #TitleCo-InventorsDate
9006854 Avalanche photodiode Tadao Ishibashi, Masahiro Nada, Yoshifumi Muramoto, Haruki Yokoyama 2015-04-14
8754445 Semiconductor device Tadao Ishibashi, Yoshifumi Muramoto, Toshihide Yoshimatsu, Haruki Yokoyama 2014-06-17
8729602 Avalanche photodiode Tadao Ishibashi, Masahiro Nada, Yoshifumi Muramoto, Haruki Yokoyama 2014-05-20
8575650 Avalanche photodiode Tadao Ishibashi, Yoshifumi Muramoto, Fumito Nakajima, Haruki Yokoyama 2013-11-05
7880197 Avalanche photodiode having doping region with monotonically increasing concentration distribution Tadao Ishibashi, Yukihiro Hirota, Yoshifumi Muramoto 2011-02-01
7787736 Semiconductor optoelectronic waveguide Tadao Ishibashi, Ken Tsuzuki 2010-08-31
7599595 Semiconductor optoelectronic waveguide Tadao Ishibashi, Ken Tsuzuki 2009-10-06
7557387 Avalanche photodiode Tadao Ishibashi, Yukihiro Hirota 2009-07-07
6920166 Thin film deposition method of nitride semiconductor and nitride semiconductor light emitting device Tetsuya Akasaka, Toshio Nishida, Naoki Kobayashi, Tadashi Saitoh 2005-07-19
5537038 Magnetic flux measuring method and apparatus for detecting high frequency components of magnetic flux with high speed orientation 1996-07-16
5512821 Method and apparatus for magnetically detecting defects in an object with compensation for magnetic field shift by means of a compensating coil Yasuhiro Matsufuji, Hiroshi Maki, Mamoru Inaba, Kenichi Iwanaga, Atsuhisa Takeoshi +1 more 1996-04-30
5502382 Apparatus for magnetic inspection using magnetic shield, with specific relation of distance E between magnetic sensors and distance L between each magnetic sensor and the object to be inspected, to obtain optimum S/N Yasuhiro Matsufuji 1996-03-26
5357198 Apparatus for magnetic inspection using magnetic shield Yasuhiro Matsufuji 1994-10-18
5287059 Saturable core magnetometer with a parallel resonant circuit in which the W3 DC level changes with a change in an external magnetic field Yoshihiro Murakami 1994-02-15
5235275 Magnetic inspection apparatus for thin steel strip having magnetizer and detection coil within a hollow roller rotated by the steel strip Masaki Takenaka, Kenichi Iwanaga, Takato Furukawa, Atsuhisa Takekoshi 1993-08-10
5151793 Recording medium playing apparatus Hiroshi Ito, Bonpei Inaba 1992-09-29
5132608 Current measuring method and apparatus therefor Katsuyuki Nishifuji 1992-07-21
4742298 Apparatus for detecting surface flaw of pipeline by electromagnetic induction Toshiaki Hosoe 1988-05-03
4716366 Eddy current distance signal apparatus with temperature change compensation means Toshiaki Hosoe, Yoshihiro Kawase 1987-12-29
4647854 Apparatus for measuring the level of the molten metal in the mold of a continuous casting machine Takeo Yamada, Yoshihiro Kawase 1987-03-03
4567435 Method and apparatus for continuously measuring distance utilizing eddy current and having temperature difference influence elimination Takeo Yamada, Tomohisa Yamamoto, Yoshihiro Kawase 1986-01-28
4309902 Method for continuously measuring steepness of defective flatness of metal strip during rolling Kazuo Sano, Katsujiro Watanabe 1982-01-12
4303883 Apparatus for detecting the center of a welded seam in accordance with fundamental harmonic component suppression Toshihiro Mori, Hironobu Akuzawa 1981-12-01
4267508 Apparatus for non-contact measurement of distance from a metallic body using a detection coil in the feedback circuit of an amplifier 1981-05-12
4186792 Apparatus for monitoring and controlling the level of the molten metal in the mold of a continuous casting machine Takeo Yamada, Yoshio Miyashita, Katsuhiko Murakami, Masahisa Tate, Kiyoshi Mizui 1980-02-05