Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12306135 | Sensitivity calibration method, inspection device, and magnetic sensor group | Takahiro Koshihara | 2025-05-20 |
| 11692970 | Leakage-flux flaw detection device | — | 2023-07-04 |
| 5512821 | Method and apparatus for magnetically detecting defects in an object with compensation for magnetic field shift by means of a compensating coil | Seigo Ando, Hiroshi Maki, Mamoru Inaba, Kenichi Iwanaga, Atsuhisa Takeoshi +1 more | 1996-04-30 |
| 5502382 | Apparatus for magnetic inspection using magnetic shield, with specific relation of distance E between magnetic sensors and distance L between each magnetic sensor and the object to be inspected, to obtain optimum S/N | Seigo Ando | 1996-03-26 |
| 5357198 | Apparatus for magnetic inspection using magnetic shield | Seigo Ando | 1994-10-18 |