Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10859507 | Surface defect inspection method and surface defect inspection apparatus | Takahiro Koshihara, Takahiko Oshige | 2020-12-08 |
| 10466039 | Surface shape measuring method and surface shape measuring device | Manabu Harazono | 2019-11-05 |