Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9389169 | Surface inspection method and surface inspection apparatus for steel sheet coated with resin | Kaoru Tanaka, Jun Sakai | 2016-07-12 |
| 7599052 | Method for marking defect and device therefor | Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige +11 more | 2009-10-06 |
| 7423744 | Method for marking defect and device therefor | Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige +11 more | 2008-09-09 |
| 7248366 | Method for marking defect and device therefor | Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige +11 more | 2007-07-24 |
| 5835220 | Method and apparatus for detecting surface flaws | Takahiko Oshige, Tsutomu Kawamura, Yuji Matoba | 1998-11-10 |
| 5438415 | Ellipsometer and method of controlling coating thickness therewith | Takahiko Oshige, Yoshiro Yamada, Takeo Yamada, Takeshi Yamazaki, Takamitsu TAKAYAMA +1 more | 1995-08-01 |
| 5335066 | Measuring method for ellipsometric parameter and ellipsometer | Takeo Yamada, Takahiko Oshige | 1994-08-02 |
| 5311285 | Measuring method for ellipsometric parameter and ellipsometer | Takahiko Oshige, Takeo Yamada | 1994-05-10 |
| 5126114 | Manufacturing method and equipment of single silicon crystal | Hiroshi Kamio, Kenji Araki, Yoshinobu Shima, Makoto Suzuki, Shigetake Horie +1 more | 1992-06-30 |
| 5087321 | Manufacturing method and equipment of single silicon crystal | Hiroshi Kamio, Kenji Araki, Yoshinobu Shima, Makoto Suzuki, Shigetake Horie | 1992-02-11 |
| 5087429 | Method and apparatus for manufacturing silicon single crystals | Hiroshi Kamio, Kenji Araki, Yoshinobu Shima, Makoto Suzuki, Shigetake Horie +1 more | 1992-02-11 |