Issued Patents All Time
Showing 1–25 of 41 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12165977 | Terahertz module | Masayuki Fujita, Daniel Jonathan Headland, Yosuke Nishida | 2024-12-10 |
| 10761126 | Electro-optic probe, electromagnetic wave measuring apparatus, and electromagnetic wave measuring method | Shintarou Hisatake, Hirohisa Uchida | 2020-09-01 |
| 10451663 | Method for measuring electromagnetic field, electromagnetic field measurement device, and phase imaging device | Shintarou Hisatake | 2019-10-22 |
| 10276919 | Terahertz device and terahertz integrated circuit | Sebastian Diebold, Masayuki Fujita, Jaeyoung Kim, Toshikazu Mukai, Kazuisao TSURUDA | 2019-04-30 |
| 9632247 | Terahertz-wave device and terahetz-wave integrated circuits | Masayuki Fujita, Kazuisao TSURUDA, Dai Onishi | 2017-04-25 |
| 9496622 | Photonic-crystal slab absorber and high-frequency circuit and electronic components, and transmitter, receiver and proximity wireless communication system | Masayuki Fujita, Ryoma Kakimi, Dai Onishi, Eiji Miyai | 2016-11-15 |
| 9188742 | Teraherz-wave connector and teraherz-wave integrated circuits, and wave guide and antenna structure | Masayuki Fujita, Tsukasa Ishigaki, Dai Onishi, Eiji Miyai | 2015-11-17 |
| 7511511 | Specific absorption rate measuring system, and a method thereof | Teruo Onishi, Ryo Yamaguchi, Shinji Uebayashi, Naofumi Shimizu, Hiroyoshi Togo | 2009-03-31 |
| 6683447 | Electro-optic apparatus for measuring signal potentials | Yoshiki Yanagisawa, Nobuaki Takeuchi, Jun Kikuchi, Yoshio Endou, Mitsuru Shinagawa +1 more | 2004-01-27 |
| 6624644 | Electro-optic probe and magneto-optic probe | Akishige Ito, Yoshiki Yanagisawa, Jun Kikuchi, Nobukazu Banjo, Sanjay Gupta +2 more | 2003-09-23 |
| 6567760 | Electro-optic sampling oscilloscope | Jun Kikuchi, Nobuaki Takeuchi, Yoshiki Yanagisawa, Nobukazu Banjo, Yoshio Endou +2 more | 2003-05-20 |
| 6507014 | Electro-optic probe | Akishige Ito, Katsushi Ohta, Toshiyuki Yagi, Mitsuru Shinagawa, Junzo Yamada | 2003-01-14 |
| 6469528 | Electro-optic sampling probe and measuring method using the same | Fumio Akikuni, Katsushi Ohta, Mitsuru Shinagawa, Junzo Yamada | 2002-10-22 |
| 6468895 | Pattern forming method | Hiromu Ishii, Shouji Yagi, Katsuyuki Machida, Kunio Saito, Hakaru Kyuragi | 2002-10-22 |
| 6452378 | Probe for electro-optic sampling oscilloscope | Noriyuki Toriyama, Toshiyuki Yagi | 2002-09-17 |
| 6445198 | Electro-optic sampling probe and a method for adjusting the same | Fumio Akikuni, Katsushi Ohta, Mitsuru Shinagawa, Junzo Yamada | 2002-09-03 |
| 6429669 | Temperature-insensitive electro-optic probe | Akishige Ito, Katsushi Ohta, Toshiyuki Yagi, Mitsuru Shinagawa, Hakaru Kyuragi | 2002-08-06 |
| 6410906 | Electro-optic probe | Akishige Ito, Katsushi Ohta, Toshiyuki Yagi, Mitsuru Shinagawa, Junzo Yamada | 2002-06-25 |
| 6407561 | Probe for electro-optic sampling oscilloscope | Akishige Ito, Katsushi Ohta, Toshiyuki Yagi, Mitsuru Shinagawa, Junzo Yamada | 2002-06-18 |
| 6403946 | Electro-optic sampling probe comprising photodiodes insulated from main frame of EOS optical system | Fumio Akikuni, Katsushi Ohta, Mitsuru Shinagawa, Junzo Yamada | 2002-06-11 |
| 6388454 | Electro-optic sampling prober | Fumio Akikuni, Katsushi Ohta, Mitsuru Shinagawa, Junzo Yamada | 2002-05-14 |
| 6384590 | Light receiving circuit for use in electro-optic sampling oscilloscope | Jun Kikuchi, Nobuaki Takeuchi, Yoshiki Yanagisawa, Nobukazu Banjo, Yoshio Endou +2 more | 2002-05-07 |
| 6377036 | Electro-optic sampling oscilloscope | Nobuaki Takeuchi, Yoshiki Yanagisawa, Jun Kikuchi, Yoshio Endou, Mitsuru Shinagawa +1 more | 2002-04-23 |
| 6369562 | Electro-optical probe for oscilloscope measuring signal waveform | Akishige Ito, Katsushi Ohta, Toshiyuki Yagi, Mitsuru Shinagawa, Junzo Yamada | 2002-04-09 |
| 6348787 | Electrooptic probe | Akishige Ito, Katsushi Ohta, Toshiyuki Yagi, Mitsuru Shinagawa, Junzo Yamada | 2002-02-19 |