Issued Patents All Time
Showing 26–41 of 41 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6347005 | Electro-optic sampling probe | Noriyuki Toriyama, Mitsuru Shinagawa, Junzo Yamada | 2002-02-12 |
| 6342783 | Electrooptic probe | Akishige Ito, Katsushi Ohta, Toshiyuki Yagi, Mitsuru Shinagawa, Junzo Yamada | 2002-01-29 |
| 6337565 | Electro-optic probe | Akishige Ito, Katsushi Ohta, Toshiyuki Yagi, Mitsuru Shinagawa, Junzo Yamada | 2002-01-08 |
| 6310507 | Timing generation circuit for electro-optic sampling oscilloscope | Nobuaki Takeuchi, Yoshiki Yanagisawa, Jun Kikuchi, Yoshio Endou, Mitsuru Shinagawa +1 more | 2001-10-30 |
| 6297650 | Electrooptic probe | Akishige Ito, Katsushi Ohta, Toshiyuki Yagi, Mitsuru Shinagawa, Junzo Yamada | 2001-10-02 |
| 6297651 | Electro-optic sampling probe having unit for adjusting quantity of light incident on electro-optic sampling optical system module | Fumio Akikuni, Katsushi Ohta, Mitsuru Shinagawa, Junzo Yamada | 2001-10-02 |
| 6288531 | Probe for electro-optic sampling oscilloscope | Akishige Ito, Katsushi Ohta, Toshiyuki Yagi, Mitsuru Shinagawa, Junzo Yamada | 2001-09-11 |
| 6288529 | Timing generation circuit for an electro-optic oscilloscope | Nobuaki Takeuchi, Yoshiki Yanagisawa, Jun Kikuchi, Nobukazu Banjou, Yoshio Endou +2 more | 2001-09-11 |
| 6252387 | Oscilloscope utilizing probe with electro-optic crystal | Nobuaki Takeuchi, Yoshiki Yanagisawa, Jun Kikuchi, Yoshio Endou, Mitsuru Shinagawa +1 more | 2001-06-26 |
| 6232765 | Electro-optical oscilloscope with improved sampling | Nobuaki Takeuchi, Yoshiki Yanagisawa, Jun Kikuchi, Nobukazu Banjo, Yoshio Endou +2 more | 2001-05-15 |
| 6201235 | Electro-optic sampling oscilloscope | Nobuaki Takeuchi, Yoshiki Yanagisawa, Jun Kikuchi, Nobukazu Banjo, Yoshio Endou +2 more | 2001-03-13 |
| 6166845 | Electro-optic probe | Akishige Ito, Katsushi Ohta, Toshiyuki Yagi, Mitsuru Shinagawa, Junzo Yamada | 2000-12-26 |
| 6087838 | Signal processing circuit for electro-optic probe | Nobuaki Takeuchi, Yoshiki Yanagisawa, Jun Kikuchi, Yoshio Endou, Mitsuru Shinagawa +1 more | 2000-07-11 |
| 5808473 | Electric signal measurement apparatus using electro-optic sampling by one point contact | Mitsuru Shinagawa, Makoto Yaita, Ken Takeya | 1998-09-15 |
| 5543723 | Apparatus for electro-optic sampling measuring of electrical signals in integrated circuits with improved probe positioning accuracy | Mitsuru Shinagawa | 1996-08-06 |
| 5274325 | Method and apparatus for electro-optic sampling measurement of electrical signals in integrated circuits | Mitsuru Shinagawa | 1993-12-28 |