Issued Patents All Time
Showing 1–22 of 22 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10018517 | Optical fiber temperature distribution measuring device | — | 2018-07-10 |
| 6766483 | Semiconductor test apparatus | — | 2004-07-20 |
| 6683447 | Electro-optic apparatus for measuring signal potentials | Yoshiki Yanagisawa, Jun Kikuchi, Yoshio Endou, Mitsuru Shinagawa, Tadao Nagatsuma +1 more | 2004-01-27 |
| 6614252 | Semiconductor test apparatus with reduced power consumption and heat generation | — | 2003-09-02 |
| 6567760 | Electro-optic sampling oscilloscope | Jun Kikuchi, Yoshiki Yanagisawa, Nobukazu Banjo, Yoshio Endou, Mitsuru Shinagawa +2 more | 2003-05-20 |
| 6566896 | Semiconductor testing apparatus | — | 2003-05-20 |
| 6512610 | Device and method for testing of multi-branch optical network | Takao Minami, Keiichi Shimizu, Koichi Shinozaki, Takamu Genji | 2003-01-28 |
| 6505312 | Integrated circuit tester | Yoshiki Yanagisawa, Chitomi Terayama, Takayuki Sugizaki | 2003-01-07 |
| 6486952 | Semiconductor test apparatus | — | 2002-11-26 |
| 6473556 | Apparatus for inspecting integrated circuits | — | 2002-10-29 |
| 6384590 | Light receiving circuit for use in electro-optic sampling oscilloscope | Jun Kikuchi, Yoshiki Yanagisawa, Nobukazu Banjo, Yoshio Endou, Mitsuru Shinagawa +2 more | 2002-05-07 |
| 6377036 | Electro-optic sampling oscilloscope | Yoshiki Yanagisawa, Jun Kikuchi, Yoshio Endou, Mitsuru Shinagawa, Tadao Nagatsuma +1 more | 2002-04-23 |
| 6310507 | Timing generation circuit for electro-optic sampling oscilloscope | Yoshiki Yanagisawa, Jun Kikuchi, Yoshio Endou, Mitsuru Shinagawa, Tadao Nagatsuma +1 more | 2001-10-30 |
| 6310702 | Testing device for multistage multi-branch optical network | Takao Minami, Naoyuki Nozaki, Koichi Shinozaki, Takamu Genji | 2001-10-30 |
| 6288529 | Timing generation circuit for an electro-optic oscilloscope | Yoshiki Yanagisawa, Jun Kikuchi, Nobukazu Banjou, Yoshio Endou, Mitsuru Shinagawa +2 more | 2001-09-11 |
| 6252387 | Oscilloscope utilizing probe with electro-optic crystal | Yoshiki Yanagisawa, Jun Kikuchi, Yoshio Endou, Mitsuru Shinagawa, Tadao Nagatsuma +1 more | 2001-06-26 |
| 6232765 | Electro-optical oscilloscope with improved sampling | Yoshiki Yanagisawa, Jun Kikuchi, Nobukazu Banjo, Yoshio Endou, Mitsuru Shinagawa +2 more | 2001-05-15 |
| 6201235 | Electro-optic sampling oscilloscope | Yoshiki Yanagisawa, Jun Kikuchi, Nobukazu Banjo, Yoshio Endou, Mitsuru Shinagawa +2 more | 2001-03-13 |
| 6087838 | Signal processing circuit for electro-optic probe | Yoshiki Yanagisawa, Jun Kikuchi, Yoshio Endou, Mitsuru Shinagawa, Tadao Nagatsuma +1 more | 2000-07-11 |
| 6028661 | Multi-branched optical line testing apparatus | Takao Minami, Naoyuki Nozaki, Koichi Shinozaki, Takamu Genji | 2000-02-22 |
| 5452071 | Method of measuring optical attenuation using an optical time domain reflectometer | — | 1995-09-19 |
| 5309455 | High-power light pulse generating apparatus | Shoji Adachi, Ryoji Handa | 1994-05-03 |