Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6505312 | Integrated circuit tester | Nobuaki Takeuchi, Yoshiki Yanagisawa, Takayuki Sugizaki | 2003-01-07 |
| 5978949 | Failure analysis device for IC tester and memory device measuring device for IC tester | — | 1999-11-02 |