Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6505312 | Integrated circuit tester | Nobuaki Takeuchi, Yoshiki Yanagisawa, Chitomi Terayama | 2003-01-07 |
| 6253341 | IC test system | — | 2001-06-26 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6505312 | Integrated circuit tester | Nobuaki Takeuchi, Yoshiki Yanagisawa, Chitomi Terayama | 2003-01-07 |
| 6253341 | IC test system | — | 2001-06-26 |