Issued Patents All Time
Showing 1–22 of 22 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10684952 | Disk device and disk device control method | Kimiyasu Aida, Hidekazu Masuyama, Hirotaka Iima, Takumi Kakuya, Takato Kuji +2 more | 2020-06-16 |
| 9053746 | Disk device and data recording method | Kenji Ogawa, Hidekazu Masuyama, Michio Yamamoto, Yuji Karakawa | 2015-06-09 |
| 7818556 | Storage apparatus, control method, and control device which can be reliably started up when power is turned on even after there is an error during firmware update | Hirotaka Iima, Hiroshi Tsurumi, Masataka Shitara, Masaaki Tamura, Yasuyuki Nagashima | 2010-10-19 |
| 6560003 | Light receiving module and light receiving method with reduced polarization dependence | Fumio Akikuni | 2003-05-06 |
| 6507014 | Electro-optic probe | Akishige Ito, Toshiyuki Yagi, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada | 2003-01-14 |
| 6469528 | Electro-optic sampling probe and measuring method using the same | Fumio Akikuni, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada | 2002-10-22 |
| 6445198 | Electro-optic sampling probe and a method for adjusting the same | Fumio Akikuni, Tadao Nagatsuma, Mitsuru Shinagawa, Junzo Yamada | 2002-09-03 |
| 6429669 | Temperature-insensitive electro-optic probe | Akishige Ito, Toshiyuki Yagi, Mitsuru Shinagawa, Tadao Nagatsuma, Hakaru Kyuragi | 2002-08-06 |
| 6410906 | Electro-optic probe | Akishige Ito, Toshiyuki Yagi, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada | 2002-06-25 |
| 6407561 | Probe for electro-optic sampling oscilloscope | Akishige Ito, Toshiyuki Yagi, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada | 2002-06-18 |
| 6403946 | Electro-optic sampling probe comprising photodiodes insulated from main frame of EOS optical system | Fumio Akikuni, Tadao Nagatsuma, Mitsuru Shinagawa, Junzo Yamada | 2002-06-11 |
| 6388454 | Electro-optic sampling prober | Fumio Akikuni, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada | 2002-05-14 |
| 6369562 | Electro-optical probe for oscilloscope measuring signal waveform | Akishige Ito, Toshiyuki Yagi, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada | 2002-04-09 |
| 6348787 | Electrooptic probe | Akishige Ito, Toshiyuki Yagi, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada | 2002-02-19 |
| 6342783 | Electrooptic probe | Akishige Ito, Toshiyuki Yagi, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada | 2002-01-29 |
| 6337565 | Electro-optic probe | Akishige Ito, Toshiyuki Yagi, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada | 2002-01-08 |
| 6297650 | Electrooptic probe | Akishige Ito, Toshiyuki Yagi, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada | 2001-10-02 |
| 6297651 | Electro-optic sampling probe having unit for adjusting quantity of light incident on electro-optic sampling optical system module | Fumio Akikuni, Tadao Nagatsuma, Mitsuru Shinagawa, Junzo Yamada | 2001-10-02 |
| 6288531 | Probe for electro-optic sampling oscilloscope | Akishige Ito, Toshiyuki Yagi, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada | 2001-09-11 |
| 6166845 | Electro-optic probe | Akishige Ito, Toshiyuki Yagi, Mitsuru Shinagawa, Tadao Nagatsuma, Junzo Yamada | 2000-12-26 |
| 5943349 | Variable wavelength laser device | — | 1999-08-24 |
| 5936982 | Variable wavelength laser light source | — | 1999-08-10 |