Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9915011 | Low resistivity single crystal silicon carbide wafer | Tatsuo Fujimoto, Noboru Ohtani, Masakazu Katsuno, Masashi Nakabayashi | 2018-03-13 |
| 9691607 | Process for producing epitaxial silicon carbide single crystal substrate and epitaxial silicon carbide single crystal substrate obtained by the same | Takashi Aigo, Hiroshi Tsuge, Taizo Hoshino, Tatsuo Fujimoto, Masakazu Katsuno +1 more | 2017-06-27 |
| 8927396 | Production process of epitaxial silicon carbide single crystal substrate | Takashi Aigo, Hiroshi Tsuge, Masakazu Katsuno, Tatsuo Fujimoto | 2015-01-06 |
| 8901570 | Epitaxial silicon carbide single crystal substrate and process for producing the same | Takashi Aigo, Hiroshi Tsuge, Taizo Hoshino, Tatsuo Fujimoto, Masakazu Katsuno +1 more | 2014-12-02 |
| 8707944 | Saw wire | Mitsuru Morita, Toshimi Tarui, Hiroaki Sakamoto, Makoto Kosaka | 2014-04-29 |
| 8044408 | SiC single-crystal substrate and method of producing SiC single-crystal substrate | Tatsuo Fujimoto, Kohei Tatsumi, Taizo Hoshino, Masakazu Katsuno, Noboru Ohtani +3 more | 2011-10-25 |
| 5017018 | Clinical thermometer | Tohru Iuchi, Yukio Nakamori, Atsushi Kawasaki, Yoh-ichi Nagatake | 1991-05-21 |
| 4912987 | Measurement of sizes of falling particles | Jiro Ohno, Yoshiteru Matsuo, Hiroshi Nishikawa, Katsuhiko Yui, Hirotoshi Kawamura | 1990-04-03 |
| 4843894 | Measurement of sizes of falling particles | Jiro Ohno, Yoshiteru Matsuo, Hiroshi Nishikawa, Katsuhiko Yui, Hirotoshi Kawamura | 1989-07-04 |
| 4641036 | Method of and apparatus for imaging surface of object at high temperature | Jiro Ohno | 1987-02-03 |
| 4641083 | Method and apparatus for supervising charges in blast furnace using electromagnetic waves | Jiro Ohno | 1987-02-03 |
| 4621264 | Method and apparatus for measuring water level in a well | Jiro Ohno | 1986-11-04 |