Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12209958 | Interferometric gas sensor | Huibert Visser | 2025-01-28 |
| 11774734 | Focal in-field pointing telescope system | Huibert Visser | 2023-10-03 |
| 11143498 | Interferometer system and use thereof | Huibert Visser | 2021-10-12 |
| 11067441 | Correction of curved projection of a spectrometer slit line | Huibert Visser | 2021-07-20 |
| 10578545 | Spatially resolved aerosol detection | Huibert Visser | 2020-03-03 |
| 10508951 | High resolution broadband monolithic spectrometer and method | Borgert Kruizinga, Frerik VAN BEIJNUM | 2019-12-17 |
| 10473526 | Spatially resolved gas detection | Huibert Visser | 2019-11-12 |
| 8064038 | Inspection apparatus, lithographic system provided with the inspection apparatus and a method for inspecting a sample | Egbert Anne Martijn Brouwer | 2011-11-22 |
| 7768627 | Illumination of a patterning device based on interference for use in a maskless lithography system | Huibert Visser | 2010-08-03 |
| 7697128 | Method of imaging radiation from an object on a detection device and an inspection device for inspecting an object | Robert Snel, Arno Jan Bleeker | 2010-04-13 |
| 7522263 | Lithographic apparatus and method | Hubert Adriaan Van Mierlo, Gert-Jan Heerens, Hans Meiling, Antonius Gerardus Theodorus Maria Bastein, Jacques Cor Johan Van Der Donck | 2009-04-21 |
| 7471398 | Method for measuring contour variations | Ian J. Saunders, Jacobus Johannes Korpershoek | 2008-12-30 |
| 7121922 | Method and apparatus for polishing a workpiece surface | — | 2006-10-17 |