Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Pedro Vagos — 10 Patents

NINanometrics Incorporated: 7 patents #13 of 127Top 15%
OIOnto Innovation: 3 patents #4 of 69Top 6%
Overall (All Time): #481,000 of 4,157,543Top 15%
10 Patents All Time
Pedro Vagos has been granted 10 US patents while listed as an inventor at Nanometrics Incorporated. The first was granted in 2008 and the most recent in September 2024. Pedro Vagos ranks #481,000 of 4,157,543 US inventors in our database (top 11.6%). Patent records list Pedro Vagos in Chennevières, OR, FR.

Patents per Year

Patents granted per year, 2008 to 2024Bar chart with a peak of 2 patents in 2018.peak 22008: 1 patents20082010: 1 patents20102013: 1 patents20132018: 2 patents20182019: 2 patents20192020: 1 patents20202022: 1 patents20222024: 1 patents2024

Issued Patents All Time

Showing 1–10 of 10 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12092962 Measurements of structures in presence of signal contaminations Jingsheng Shi, Yiliang Liu, Jie Li 2024-09-17 $53,614,000
11346768 Vortex polarimeter Kenneth E. James, John Lesoine 2022-05-31
10621264 Correction of angular error of plane-of-incidence azimuth of optical metrology device Ye Feng, Daniel Thompson, Yan Zhang 2020-04-14
10296554 Correction of angular error of plane-of-incidence azimuth of optical metrology device Ye Feng, Daniel Thompson, Yan Zhang 2019-05-21 $7,049,000
10274367 Deconvolution to reduce the effective spot size of a spectroscopic optical metrology device Amit Shachaf, Michael Elad 2019-04-30 $9,313,000
9995689 Optical metrology using differential fitting 2018-06-12 $9,785,000
9958327 Deconvolution to reduce the effective spot size of a spectroscopic optical metrology device Amit Shachaf, Michael Elad 2018-05-01 $4,500,000
8427645 Mueller matrix spectroscopy using chiroptic Pablo I. Rovira 2013-04-23 $2,177,000
7751061 Non-contact apparatus and method for measuring a property of a dielectric layer on a wafer 2010-07-06 $3,981,000
7410815 Apparatus and method for non-contact assessment of a constituent in semiconductor substrates 2008-08-12 $1,153,000