Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12259338 | Mitigation of undesired spectral effects in optical metrology | Petar Zuvela, Wei Ming Chiew, Jie Li | 2025-03-25 |
| 12092962 | Measurements of structures in presence of signal contaminations | Yiliang Liu, Jie Li, Pedro Vagos | 2024-09-17 |