Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Deconvolution to reduce the effective spot size of a spectroscopic optical metrology device

Deconvolution to reduce the effective spot size of a spectroscopic optical metrology device

US Patent 10274367 · Granted Apr 30, 2019

Estimated economic value: $9,313,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Measurements of structures in presence of signal contaminations2024
System for imaging lesions aligning tissue surface2023
Vortex polarimeter2022
Focus system for oblique optical metrology device2022
System for imaging lesions aligning tissue surfaces2021
Correction of angular error of plane-of-incidence azimuth of optical metrology d2020
Diagnostic system for the detection of skin cancer2020
Correction of angular error of plane-of-incidence azimuth of optical metrology d2019
System for imaging lesions aligning tissue surfaces2019
Optical metrology using differential fitting2018
Deconvolution to reduce the effective spot size of a spectroscopic optical metro2018
Deconvolution to reduce the effective spot size of a spectroscopic optical metro2018