Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11744510 | System for imaging lesions aligning tissue surface | Catherine M. Shachaf | 2023-09-05 |
| 11346790 | Focus system for oblique optical metrology device | Daniel Thompson, John Lesoine | 2022-05-31 |
| 11185278 | System for imaging lesions aligning tissue surfaces | Catherine M. Shachaf | 2021-11-30 |
| 10531824 | Diagnostic system for the detection of skin cancer | Catherine M. Shachaf | 2020-01-14 |
| 10274367 | Deconvolution to reduce the effective spot size of a spectroscopic optical metrology device | Pedro Vagos, Michael Elad | 2019-04-30 |
| 10165976 | System for imaging lesions aligning tissue surfaces | Catherine M. Shachaf | 2019-01-01 |
| 9958327 | Deconvolution to reduce the effective spot size of a spectroscopic optical metrology device | Pedro Vagos, Michael Elad | 2018-05-01 |
| 9903806 | Focusing system with filter for open or closed loop control | — | 2018-02-27 |
| 9243999 | Ellipsometer focusing system | Barry Blasenheim | 2016-01-26 |
| 8642009 | Diagnostic system for the detection of skin cancer | Catherine M. Shachaf | 2014-02-04 |
| 8559008 | Ellipsometer focusing system | Barry Blasenheim | 2013-10-15 |
| 7446321 | Differential wavelength photoluminescence for non-contact measuring of contaminants and defects located below the surface of a wafer or other workpiece | Nicolas Laurent, Andrzej Buczkowski, Steven G. Hummel, Tom Walker | 2008-11-04 |