AB

Andrzej Buczkowski

NI Nanometrics Incorporated: 4 patents #21 of 127Top 20%
SU Sumco: 3 patents #118 of 464Top 30%
SP Sumco Phoenix: 2 patents #5 of 10Top 50%
📍 Elmhurst, NY: #7 of 128 inventorsTop 6%
🗺 New York: #13,384 of 115,490 inventorsTop 15%
Overall (All Time): #461,466 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDate
9846122 Optical metrology system for spectral imaging of a sample Mikhail Sluch 2017-12-19
9182351 Optical metrology system for spectral imaging of a sample 2015-11-10
8673075 Procedure for in-situ determination of thermal gradients at the crystal growth front Benno Orschel, Joel Kearns, Keiichi Takanashi, Volker Todt 2014-03-18
8330946 Silicon filter for photoluminescence metrology Christopher Raymond 2012-12-11
8286812 Device and method for irreversibly selecting indicia 2012-10-16
8221545 Procedure for in-situ determination of thermal gradients at the crystal growth front Benno Orschel, Joel Kearns, Keiichi Takanashi, Volker Todt 2012-07-17
7521954 Method for determining a minority carrier diffusion length using surface photo voltage measurements Benno Orschel, Fritz Kirscht 2009-04-21
7446321 Differential wavelength photoluminescence for non-contact measuring of contaminants and defects located below the surface of a wafer or other workpiece Nicolas Laurent, Steven G. Hummel, Tom Walker, Amit Shachaf 2008-11-04
5996268 Fishing rod motion indicator with visual and audible features Witalis Talejko 1999-12-07
5937566 Fishing bobber with variable illumination Witalis Talejko 1999-08-17
D326882 Sculptured toy figure 1992-06-09