BC

Byung-Jin Choi

MI Molecular Imprints: 96 patents #1 of 97Top 2%
Canon: 63 patents #420 of 19,416Top 3%
DC Dongwoo Fine-Chem Co.: 63 patents #1 of 450Top 1%
University Of Texas System: 26 patents #31 of 6,559Top 1%
LG: 10 patents #4,416 of 26,165Top 20%
Samsung: 8 patents #15,984 of 75,807Top 25%
UT University Of Texas: 2 patents #10 of 278Top 4%
KR Kreemo: 2 patents #14 of 17Top 85%
US University Of Texas System: 1 patents #51 of 217Top 25%
GC Goldstar Co.: 1 patents #307 of 863Top 40%
🗺 Texas: #40 of 125,132 inventorsTop 1%
Overall (All Time): #1,856 of 4,157,543Top 1%
257
Patents All Time

Issued Patents All Time

Showing 226–250 of 257 patents

Patent #TitleCo-InventorsDate
7150622 Systems for magnification and distortion correction for imprint lithography processes Sidlgata V. Sreenivasan, Mario Johannes Meissl 2006-12-19
7098572 Apparatus to control displacement of a body spaced-apart from a surface Sidlgata V. Sreenivasan, Stephen C. Johnson 2006-08-29
7077992 Step and repeat imprint lithography processes Sidlgata V. Sreenivasan, Norman E. Schumaker, Ronald D. Voisin, Michael Watts, Mario Johannes Meissl 2006-07-18
7070405 Alignment systems for imprint lithography Sidlgata V. Sreenivasan, Michael Watts, Ronald D. Voisin, Norman E. Schumaker 2006-07-04
7060324 Method of creating a dispersion of a liquid on a substrate Todd C. Bailey, Matthew E. Colburn, Sidlgata V. Sreenivasan, C. Grant Willson, John Ekerdt 2006-06-13
7060402 Method of orientating a template with respect to a substrate in response to a force exerted on the template Sidlgata V. Sreenivasan, Stephen C. Johnson 2006-06-13
7036389 System for determining characteristics of substrates employing fluid geometries Sidlgata V. Sreenivasan 2006-05-02
7019819 Chucking system for modulating shapes of substrates Ronald D. Voisin, Sidlgata V. Sreenivasan, Michael Watts, Daniel Babbs, Mario Johannes Meissl +2 more 2006-03-28
7019835 Method and system to measure characteristics of a film disposed on a substrate Ian McMackin, Phillip D. Schumaker, Sidlgata V. Sreenivasan, Michael Watts 2006-03-28
6990870 System for determining characteristics of substrates employing fluid geometries Sidlgata V. Sreenivasan 2006-01-31
6986975 Method of aligning a template with a substrate employing moire patterns Sidlgata V. Sreenivasan, Matthew E. Colburn, Todd C. Bailey 2006-01-17
6982783 Chucking system for modulating shapes of substrates Ronald D. Voisin, Sidlgata V. Sreenivasan, Michael Watts, Daniel Babbs, Mario Johannes Meissl +2 more 2006-01-03
6980282 Method for modulating shapes of substrates Ronald D. Voisin, Sidlgata V. Sreenivasan, Michael Watts, C. Grant Willson, Norman E. Schumaker +1 more 2005-12-27
6955868 Method to control the relative position between a body and a surface Sidlgata V. Sreenivasan, Stephen C. Johnson 2005-10-18
6954275 Methods for high-precision gap and orientation sensing between a transparent template and substrate for imprint lithography Matthew E. Colburn, S. Sreenivasan, C. Grant Willson, Todd C. Bailey, John Ekerdt 2005-10-11
6951173 Assembly and method for transferring imprint lithography templates Mario Johannes Meissl 2005-10-04
6932934 Formation of discontinuous films during an imprint lithography process Mario Johannes Meissl, Sidlagata V. Sreenivasan, Michael Watts 2005-08-23
6926929 System and method for dispensing liquids Michael Watts, Sidlgata V. Sreenivasan 2005-08-09
6922906 Apparatus to orientate a body with respect to a surface Sidlgata V. Sreenivasan, Stephen C. Johnson 2005-08-02
6921615 High-resolution overlay alignment methods for imprint lithography Sidlgata V. Sreenivasan, Matthew E. Colburn, Todd C. Bailey 2005-07-26
6919152 High resolution overlay alignment systems for imprint lithography S. Sreenivasan, Matthew E. Colburn, Todd C. Bailey 2005-07-19
6916584 Alignment methods for imprint lithography Sidlgata V. Sreenivasan, Michael Watts, Ronald D. Voisin 2005-07-12
6916585 Method of varying template dimensions to achieve alignment during imprint lithography Sidlgata V. Sreenivasan, Matthew E. Colburn, Todd C. Bailey 2005-07-12
6902853 Dual wavelength method of determining a relative position of a substrate and a template Sidlgata V. Sreenivasan, Matthew E. Colburn, Todd C. Bailey 2005-06-07
6900881 Step and repeat imprint lithography systems Sidlgata V. Sreenivasan, Michael Watts, Mario Johannes Meissl, Norman E. Schumaker, Ronald D. Voisin 2005-05-31