Issued Patents All Time
Showing 26–50 of 66 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10229830 | Method of manufacturing silicon carbide epitaxial wafer | Kenichi Hamano, Takuyo Nakamura | 2019-03-12 |
| 9400172 | Film thickness measurement method | Kenichi Hamano | 2016-07-26 |
| 9338910 | Electronic device and sealed structure | — | 2016-05-10 |
| 8718723 | Device housing, mobile terminal device, and method therefor | Takashi Suzuki, Hidekatsu Kobayashi, Kouki Murakami, Hidehiko Hizuka | 2014-05-06 |
| 8708392 | Retractable vehicle seat | Taiyou Otsuka, Toshio Araki, Eiji Mizutani, Masashi Fujimoto, Shinji Yamada +1 more | 2014-04-29 |
| 8496361 | Illumination device including light source, light diffuser and light shield, and manufacturing method thereof | Masamichi Watanabe, Hidekatsu Kobayashi, Shoh Tsuchiya, Nariyasu Hayakawa | 2013-07-30 |
| 8492774 | Method and apparatus for manufacturing a SiC single crystal film | Kazuhiko Kusunoki, Kazuhito Kamei, Nobuyoshi Yashiro | 2013-07-23 |
| 8301213 | Electronic device including a waterproof sheet member | Wataru Murata, Takeshi Komuro, Manabu Hongo, Hidekatsu Kobayashi, Takashi Suzuki +1 more | 2012-10-30 |
| 8238969 | Mobile device | Hiroaki Matsuda, Tatsuhito Araki, Yoshiya Matsumoto, Manabu Sotodate, Wataru Murata +1 more | 2012-08-07 |
| 8036725 | Mobile device | Tatsuhito Araki, Hiroaki Matsuda, Yoshiya Matsumoto, Manabu Sotodate, Wataru Murata +1 more | 2011-10-11 |
| 8024015 | Mobile device | Tatsuhito Araki, Hiroaki Matsuda, Yoshiya Matsumoto, Manabu Sotodate, Wataru Murata +1 more | 2011-09-20 |
| 7704556 | Silicon nitride film forming method | Hitoshi Morisaki, Yasushi Kamiya, Shuji Nomura, Masahiro Totuka, Tomoki Oku | 2010-04-27 |
| 7042053 | Semiconductor device with polymer insulation of some electrodes | Tetsuo Kunii, Hiroshi Kawata | 2006-05-09 |
| 6933250 | Process for manufacturing a semiconductor device | Masahiro Totsuka, Tomoki Oku | 2005-08-23 |
| 6819119 | Method for evaluating a crystalline semiconductor substrate | Yoshitsugu Yamamoto, Satoshi Suzuki | 2004-11-16 |
| 6791335 | Sample assembly for thermoelectric analyzer | Taisei Hirayama, Masanobu Inami, Shuichi Matsuo, Koichiro Ito, Yoshitugu Yamamoto +2 more | 2004-09-14 |
| 6570390 | Method for measuring surface leakage current of sample | Taisei Hirayama, Koichiro Ito, Yoshitsugu Yamamoto, Yoshihiro Notani, Shinichi Miyakuni | 2003-05-27 |
| 6355951 | Field effect semiconductor device | — | 2002-03-12 |
| 6043520 | III-V heterojunction bipolar transistor having a GaAs emitter ballast | Yoshitsugu Yamamoto | 2000-03-28 |
| 5864169 | Semiconductor device including plated heat sink and airbridge for heat dissipation | Teruyuki Shimura, Masayuki Sakai, Hiroshi Matsuoka, Manabu Katoh | 1999-01-26 |
| 5777389 | Semiconductor device including ohmic contact to-n-type GaAs | — | 1998-07-07 |
| 5726468 | Compound semiconductor bipolar transistor | Tomoki Oku, Hirofumi Nakano, Shinichi Miyakuni, Teruyuki Shimura | 1998-03-10 |
| 5693560 | Semiconductor device electrode | Yasutaka Kohno, Tetsuro Kunii | 1997-12-02 |
| 5587792 | Apparatus and method for measuring thickness of thin semiconductor multi-layer film | Seiji Nishizawa, Tokuji Takahashi | 1996-12-24 |
| 5523840 | Method and apparatus for measuring the thicknesses of layers of a multiple layer semiconductor film utilizing the comparison between a spatialgram and an optical characteristic matrix | Seiji Nishizawa, Tokuji Takahashi | 1996-06-04 |