Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11948794 | Method of manufacturing silicon carbide epitaxial wafer | Masashi Sakai, Takuma Mizobe | 2024-04-02 |
| 10886184 | Test condition determining apparatus and test condition determining method | Masashi Sakai | 2021-01-05 |
| 10229830 | Method of manufacturing silicon carbide epitaxial wafer | Kenichi Hamano, Ryo Hattori | 2019-03-12 |
| 9530703 | Method for manufacturing silicon carbide semiconductor device | Hiroshi Sugimoto | 2016-12-27 |
| 8932944 | Silicon carbide semiconductor device manufacturing method | Yoichiro Tarui, Naoto Kaguchi | 2015-01-13 |
| 8525189 | Silicon carbide semiconductor device | Yoichiro Tarui, Naoto Kaguchi | 2013-09-03 |