Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5587792 | Apparatus and method for measuring thickness of thin semiconductor multi-layer film | Seiji Nishizawa, Ryo Hattori | 1996-12-24 |
| 5542707 | Subframe assembly for vehicle | Takahiro Kamei, Shinji Hinosawa, Yoshiji Terada, Takeaki Nakajima, Yoshiyasu Sakata | 1996-08-06 |
| 5523840 | Method and apparatus for measuring the thicknesses of layers of a multiple layer semiconductor film utilizing the comparison between a spatialgram and an optical characteristic matrix | Seiji Nishizawa, Ryo Hattori | 1996-06-04 |
| 5371596 | Optical apparatus components having spectrally overlapping characteristics for measuring semiconductor layer thickness | Ryo Hattori, Seizi Nishizawa, Ryoichi Fukasawa | 1994-12-06 |