Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10054685 | Foreign-matter detecting apparatus and method for detecting foreign-matter in powder using terahertz pulse wave | Shigenori Tominaga | 2018-08-21 |
| 9063078 | Method and apparatus for measuring characteristics of object | Takashi Kondo, Kazuhiro Takigawa, Seiji Kamba, Tomofumi Ikari | 2015-06-23 |
| 6661519 | Semiconductor impurity concentration testing apparatus and semiconductor impurity concentration testing method | — | 2003-12-09 |
| 5371596 | Optical apparatus components having spectrally overlapping characteristics for measuring semiconductor layer thickness | Ryo Hattori, Seizi Nishizawa, Tokuji Takahashi | 1994-12-06 |