Issued Patents All Time
Showing 1–23 of 23 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11833455 | Separation recovery system and separation recovery method | Takashi Kondo, Masaru Banju | 2023-12-05 |
| 11202996 | Filtration filter | Takashi Kondo, Masaru Banju, Seiichi Matsumoto, Wataru Yamamoto, Yoshiji Okamoto | 2021-12-21 |
| 11041787 | Aperture array and production method therefor | Naoki Kawara, Masaru Banju, Takashi Kondo | 2021-06-22 |
| 10729993 | Filtration filter | Takashi Kondo, Yoshiji Okamoto | 2020-08-04 |
| 10408751 | Measurement method and measurement system | Takashi Kondo, Naoki Kawara, Takashi Shimizu | 2019-09-10 |
| 10408750 | Void-arranged structure and measurement method using the same | Takashi Kondo, Kazuhiro Takigawa | 2019-09-10 |
| 10399042 | Filtration filter | Takashi Kondo, Masaru Banju, Seiichi Matsumoto, Wataru Yamamoto, Yoshiji Okamoto | 2019-09-03 |
| 10266875 | Extraction method, analytical method, extraction device, and analytical device | Takashi Kondo, Makoto Hasegawa | 2019-04-23 |
| 10215947 | Fixing instrument and metal mesh device | Yoshiji Okamoto | 2019-02-26 |
| 9366620 | Specimen measuring method | Takashi Kondo, Yuichi Ogawa, Sakura Tomita | 2016-06-14 |
| 9341561 | Aperture array structure and measurement method using the same | Takashi Kondo, Yuichi Ogawa | 2016-05-17 |
| 9329125 | Perforated-structure body, manufacturing method therefor, and measurement apparatus and measurement method | Takashi Kondo, Tetsuzo Hara, Masayuki Suzuki | 2016-05-03 |
| 9075006 | Measurement device and feature measurement method of object to be measured employing same | Takashi Kondo | 2015-07-07 |
| 9063078 | Method and apparatus for measuring characteristics of object | Takashi Kondo, Kazuhiro Takigawa, Ryoichi Fukasawa, Tomofumi Ikari | 2015-06-23 |
| 9007578 | Method for measurement of properties of analyte | Kazuhiro Takigawa, Takashi Kondo, Yuichi Ogawa | 2015-04-14 |
| 8912497 | Measurement structure, method of manufacturing same, and measuring method using same | Takashi Kondo | 2014-12-16 |
| 8610071 | Method of measuring characteristics of specimen, and flat-plate periodic structure | Kazuhiro Takigawa, Takashi Kondo, Koji Tanaka | 2013-12-17 |
| 8514403 | Sample analysis method | Yuichi Ogawa, Shinichiro Hayashi, Takashi Kondo | 2013-08-20 |
| 8304732 | Method of measuring characteristics of specimen and flat-plate periodic structure | Kazuhiro Takigawa, Takashi Kondo, Koji Tanaka | 2012-11-06 |
| 8269967 | Method for measuring characteristic of object to be measured, structure causing diffraction phenomenon, and measuring device | Takashi Kondo, Koji Tanaka, Kazuhiro Takigawa, Yuichi Ogawa | 2012-09-18 |
| 6630875 | Dual-mode band-pass filter | Naoki Mizoguchi, Hisatake Okamura | 2003-10-07 |
| 6545568 | Dual-mode band-pass filter | Naoki Mizoguchi, Hisatake Okamura | 2003-04-08 |
| 6507251 | Dual-mode band-pass filter | Naoki Mizoguchi, Hisatake Okamura | 2003-01-14 |