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Yoshitsugu Yamamoto

Mitsubishi Electric: 28 patents #534 of 25,717Top 3%
RI Rigaku: 1 patents #152 of 239Top 65%
Overall (All Time): #138,459 of 4,157,543Top 4%
28
Patents All Time

Issued Patents All Time

Showing 1–25 of 28 patents

Patent #TitleCo-InventorsDate
10854523 Semiconductor device Koichiro Nishizawa, Katsumi Miyawaki, Shinsuke Watanabe, Toshihiko Shiga 2020-12-01
9508564 Method for manufacturing semiconductor device Yoshinori Yokoyama, Kazuyo Endo, Jun Fujita, Shinnosuke Soda, Kazuyasu Nishikawa +2 more 2016-11-29
9159654 Semiconductor device Youichi Nogami, Hidetoshi Koyama 2015-10-13
9117742 High electron mobility transistor with shortened recovery time Hiroyuki Kinoshita, Tetsuo Kunii 2015-08-25
8912099 Method of manufacturing semiconductor device Kenichiro Kurahashi, Yoshitaka Kamo 2014-12-16
8878333 Semiconductor device having improved RF characteristics and moisture resistance and method for manufacturing the same Youichi Nogami, Hidetoshi Koyama 2014-11-04
8816493 Semiconductor device Yoichi Nogami, Akira Inoue, Yoshinori Yokoyama, Jun Fujita, Kazuyo Endo +2 more 2014-08-26
8247844 Semiconductor device and manufacturing method thereof Toshiyuki Oishi, Hiroshi Otsuka, Koji Yamanaka, Akira Inoue 2012-08-21
8232609 Semiconductor device including field effect transistor with reduced electric field concentration Tetsuo Kunii, Hirotaka Amasuga, Youichi Nogami 2012-07-31
7700972 Semiconductor device Hideo Takeuchi 2010-04-20
7656514 Method and apparatus for evaluating semiconductor layers Hideo Takeuchi 2010-02-02
7612633 High-frequency switch Masatake Hangai, Yukinobu Tarui, Tamotsu Nishino, Moriyasu Miyazaki, Yoji Isota 2009-11-03
7528443 Semiconductor device with recessed gate and shield electrode Tetsuo Kunii, Hirotaka Amasuga 2009-05-05
7420684 Method and apparatus for measuring surface carrier recombination velocity and surface Fermi level Hideo Takeuchi 2008-09-02
7038768 Optical measuring method for semiconductor multiple layer structures and apparatus therefor Hideo Takeuchi 2006-05-02
6998615 Method for evaluating piezoelectric fields Hideo Takeuchi, Takahide Ishikawa 2006-02-14
6911837 Method and apparatus for evaluating and adjusting microwave integrated circuit Takahide Ishikawa, Tetsuo Kunii, Satoshi Suzuki, Hirotaka Amasuga 2005-06-28
6819119 Method for evaluating a crystalline semiconductor substrate Satoshi Suzuki, Ryo Hattori 2004-11-16
6570390 Method for measuring surface leakage current of sample Taisei Hirayama, Koichiro Ito, Ryo Hattori, Yoshihiro Notani, Shinichi Miyakuni 2003-05-27
6043520 III-V heterojunction bipolar transistor having a GaAs emitter ballast Ryo Hattori 2000-03-28
6037242 Method of making hetero-structure Norio Hayafuji 2000-03-14
5874753 Field effect transistor Norio Hayafuji 1999-02-23
5811843 Field effect transistor Norio Hayafuji 1998-09-22
5796127 High electron mobility transistor Norio Hayafuji, Hirotaka Kizuki 1998-08-18
5729030 Semiconductor device Norio Hayafuji 1998-03-17