Issued Patents All Time
Showing 51–75 of 126 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6055199 | Test circuit for a semiconductor memory device and method for burn-in test | Kei Hamade, Takashi Kono, Mikio Asakura | 2000-04-25 |
| 5999464 | Semiconductor memory device and method of checking same for defect | Hideto Hidaka, Mikio Asakura, Tetsuo Kato | 1999-12-07 |
| 5995435 | Semiconductor memory device having controllable supplying capability of internal voltage | Takeshi Hamamoto, Yoshikazu Morooka | 1999-11-30 |
| 5986964 | Semiconductor memory device consistently operating a plurality of memory cell arrays distributed in arrangement | Takuya Ariki, Takeshi Hamamoto | 1999-11-16 |
| 5970507 | Semiconductor memory device having a refresh-cycle program circuit | Tetsuo Kato, Hideto Hidaka, Mikio Asakura | 1999-10-19 |
| 5953261 | Semiconductor memory device having data input/output circuit of small occupied area capable of high-speed data input/output | Tsukasa Ooishi, Mikio Asakura, Hideto Hidaka, Kei Hamade, Yoshito Nakaoka | 1999-09-14 |
| 5936443 | Power-on reset signal generator for semiconductor device | Kenichi Yasuda, Tsukasa Ooishi, Hideto Hidaka | 1999-08-10 |
| 5926051 | Self refresh timer | — | 1999-07-20 |
| 5907509 | Semiconductor memory device that can read out data at high speed | Hiroshi Miyamoto | 1999-05-25 |
| 5901102 | Semiconductor memory device achieving reduction in access time without increase in power consumption | — | 1999-05-04 |
| RE36169 | Semiconductor memory device | — | 1999-03-30 |
| 5877651 | Semiconductor memory device that can have power consumption reduced | — | 1999-03-02 |
| 5867439 | Semiconductor memory device having internal address converting function, whose test and layout are conducted easily | Mikio Asakura, Hideto Hidaka, Kenichi Yasuda | 1999-02-02 |
| 5867436 | Random access memory with a plurality amplifier groups for reading and writing in normal and test modes | Koichiro Mashiko, Kazutami Arimoto, Noriaki Matsumoto, Yoshio Matsuda | 1999-02-02 |
| 5844849 | Dynamic semiconductor memory device having fast operation mode and operating with low current consumption | — | 1998-12-01 |
| 5841705 | Semiconductor memory device having controllable supplying capability of internal voltage | Takeshi Hamamoto, Yoshikazu Morooka | 1998-11-24 |
| 5796287 | Output driver circuit for suppressing noise generation and integrated circuit device for burn-in test | Hideyuki Ozaki | 1998-08-18 |
| 5793686 | Semiconductor memory device having data input/output circuit of small occupied area capable of high-speed data input/output | Tsukasa Ooishi, Mikio Asakura, Hideto Hidaka, Kei Hamade, Yoshito Nakaoka | 1998-08-11 |
| 5786719 | Mode setting circuit and mode setting apparatus used to select a particular semiconductor function | — | 1998-07-28 |
| 5764576 | Semiconductor memory device and method of checking same for defect | Hideto Hidaka, Mikio Asakura, Tetsuo Kato | 1998-06-09 |
| 5757711 | Amplifier circuit and complementary amplifier circuit with limiting function for output lower limit | Yoshito Nakaoka, Mikio Asakura | 1998-05-26 |
| 5757228 | Output driver circuit for suppressing noise generation and integrated circuit device for burn-in test | Hideyuki Ozaki | 1998-05-26 |
| 5740119 | Semiconductor memory device having internal address converting function, whose test and layout are conducted easily | Mikio Asakura, Hideto Hidaka, Kenichi Yasuda | 1998-04-14 |
| 5729502 | Semiconductor memory device that can read out data at high speed | Hiroshi Miyamoto | 1998-03-17 |
| 5726940 | Semiconductor memory device of which prescribed state of operation is terminated under a prescribed condition and method of operating a semiconductor memory device for terminating prescribed state of operation | Mikio Asakura, Hideto Hidaka | 1998-03-10 |