Issued Patents All Time
Showing 26–37 of 37 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9313372 | Unit pixel and image sensor comprising the unit pixel circuit | Haekyung Kong, Han Soo Lee, Taechan Kim, Jungchak Ahn, Moosup Lim | 2016-04-12 |
| 9257461 | Image device including dynamic vision sensor, ambient light sensor and proximity sensor function | Soonik CHO, Moo Young Kim, Taechan Kim, Jae Cheol Yun | 2016-02-09 |
| 9165966 | CMOS image sensors including an isolation region adjacent a light-receiving region | Jae Sung Shin, Sungsoo CHOI, Hyoungsoo Ko, Taechan Kim | 2015-10-20 |
| 8462726 | Method for performing ranging procedure | Kyu Jin Park, Hyung Ho Park, Doo Hyun Seong, Eun Jong Lee, Jin Soo Choi +2 more | 2013-06-11 |
| 8373273 | Methods of forming integrated circuit devices having damascene interconnects therein with metal diffusion barrier layers and devices formed thereby | Hyeok-Sang Oh, Woo Jin Jang, Bum Ki Moon, Ji-Hong Choi, Tien-Jen Cheng | 2013-02-12 |
| 8232200 | Methods of forming integrated circuit devices having damascene interconnects therein with metal diffusion barrier layers and devices formed thereby | Hyeok-Sang Oh, Woo Jin Jang, Bum Ki Moon, Ji-Hong Choi, Tien-Jen Cheng | 2012-07-31 |
| 6982226 | Method of fabricating a contact with a post contact plug anneal | Sailesh Mansinh Merchant, Binh Nguyenphu | 2006-01-03 |
| 6703712 | Microelectronic device layer deposited with multiple electrolytes | Daniele Gilkes, Sailesh Mansinh Merchant | 2004-03-09 |
| 6573183 | Method and apparatus for controlling contamination during the electroplating deposition of metals onto a semiconductor wafer surface | Sailesh Mansinh Merchant, Deepak A. Ramappa | 2003-06-03 |
| 6331484 | Titanium-tantalum barrier layer film and method for forming the same | Siddhartha Bhowmik, Sailesh Mansinh Merchant, Pradip K. Roy, Sidhartha Sen | 2001-12-18 |
| 6147388 | Polycide gate structure with intermediate barrier | Yi Ma, Sailesh Mansinh Merchant, Pradip K. Roy | 2000-11-14 |
| 5950096 | Process for improving device yield in integrated circuit fabrication | Robert Huang, David K. Hwang, Stephen C. Kuehne, Jean L. Lee, Jane Qian Liu +1 more | 1999-09-07 |