| 6181617 |
Method and apparatus for testing a semiconductor device |
Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller +2 more |
2001-01-30 |
| 6052322 |
Memory circuit voltage regulator |
Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller +2 more |
2000-04-18 |
| 6028799 |
Memory circuit voltage regulator |
Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer +1 more |
2000-02-22 |
| 6026040 |
Method of altering the margin affecting a memory cell |
Kurt D. Beigel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller +2 more |
2000-02-15 |
| 6011731 |
Cell plate regulator |
Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer +1 more |
2000-01-04 |
| 6008533 |
Controlling impedances of an integrated circuit |
Gordon D. Roberts, Aaron Schoenfeld |
1999-12-28 |
| 5982687 |
Method of detecting leakage within a memory cell capacitor |
Kurt D. Beigel, Manny K. F. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer +1 more |
1999-11-09 |
| 5976911 |
Controlling impedances of an integrated circuit |
Gordon D. Roberts, Aaron Schoenfeld |
1999-11-02 |
| 5923672 |
Multipath antifuse circuit |
Gordon D. Roberts, Kurt D. Beigel, Eric T. Stubbs |
1999-07-13 |
| 5894165 |
Leads between chips assembly |
Manny K. F. Ma, Daryl L. Habersetzer, Gordon D. Roberts, James E. Miller |
1999-04-13 |
| 5877993 |
Memory circuit voltage regulator |
Kurt D. Biegel, Douglas J. Cutter, Manny K. F. Ma, Gordon D. Roberts, James E. Miller +2 more |
1999-03-02 |
| 5770480 |
Method of leads between chips assembly |
Manny K. F. Ma, Daryl L. Habersetzer, Gordon D. Roberts, James E. Miller |
1998-06-23 |
| 5677567 |
Leads between chips assembly |
Manny K. F. Ma, Daryl L. Habersetzer, Gordon D. Roberts, James E. Miller |
1997-10-14 |
