Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8481432 | Fabrication of semiconductor interconnect structure | Steven T. Mayer, Eric G. Webb | 2013-07-09 |
| 7972970 | Fabrication of semiconductor interconnect structure | Steven T. Mayer, Eric G. Webb | 2011-07-05 |
| 7531463 | Fabrication of semiconductor interconnect structure | Steven T. Mayer, Heung Lak Park, Timothy Cleary, Thomas W. Mountsier | 2009-05-12 |
| 7338908 | Method for fabrication of semiconductor interconnect structure with reduced capacitance, leakage current, and improved breakdown voltage | Steven T. Mayer, Heung Lak Park, Timothy Cleary, Thomas W. Mountsier | 2008-03-04 |
| 6312486 | Slurry with chelating agent for chemical-mechanical polishing of a semiconductor wafer and methods related thereto | Gurtej S. Sandhu, Donald L. Westmoreland | 2001-11-06 |
| 6234877 | Method of chemical mechanical polishing | Sung-Cheol Kim, Gurtej S. Sandhu | 2001-05-22 |
| 6120354 | Method of chemical mechanical polishing | Sung-Cheol Kim, Gurtej S. Sandhu | 2000-09-19 |
| 6099604 | Slurry with chelating agent for chemical-mechanical polishing of a semiconductor wafer and methods related thereto | Gurtej S. Sandhu, Donald L. Westmoreland | 2000-08-08 |
| 5934980 | Method of chemical mechanical polishing | Sung-Cheol Kim, Gurtej S. Sandhu | 1999-08-10 |
| 5741547 | Method for depositing a film of titanium nitride | Salman Akram | 1998-04-21 |
| 5413941 | Optical end point detection methods in semiconductor planarizing polishing processes | Scott Meikle | 1995-05-09 |