WS

William Schwarz

Lsi Logic: 10 patents #161 of 1,957Top 9%
LS Lsi: 2 patents #602 of 1,740Top 35%
Apple: 1 patents #12,251 of 18,612Top 70%
FS Freeescale Semiconductor: 1 patents #2,021 of 3,767Top 55%
Overall (All Time): #334,120 of 4,157,543Top 9%
14
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12316483 Encoding and decoding for PAM transmitter and receiver Jose A. Tierno, Sanjeev S. Gokhale, Sunil Bhosekar 2025-05-27
8700878 Event triggered memory mapped access Joseph P. Gergen, Jason T. Nearing, Zheng Xu 2014-04-15
7493541 Method and system for performing built-in-self-test routines using an accumulator to store fault information Ghasi R. Agrawal, Mukesh K. Puri 2009-02-17
7260758 Method and system for performing built-in self-test routines using an accumulator to store fault information Ghasi R. Agrawal, Mukesh K. Puri 2007-08-21
7076699 Method for testing semiconductor devices having built-in self repair (BISR) memory Mukesh K. Puri, Ghasi R. Agrawal 2006-07-11
6795942 Built-in redundancy analysis for memories with row and column repair 2004-09-21
6505313 Multi-condition BISR test mode for memories with redundancy Tuan Phan 2003-01-07
6505308 Fast built-in self-repair circuit 2003-01-07
6496947 Built-in self repair circuit with pause for data retention coverage 2002-12-17
6255836 Built-in self-test unit having a reconfigurable data retention test V. Swamy Irrinki 2001-07-03
6067262 Redundancy analysis for embedded memories with built-in self test and built-in self repair V. Swamy Irrinki, Tuan Phan 2000-05-23
5982681 Reconfigurable built-in self test circuit 1999-11-09
5909404 Refresh sampling built-in self test and repair circuit 1999-06-01
5835429 Data retention weak write circuit and method of using same 1998-11-10