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Encoding and decoding for PAM transmitter and receiver |
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Event triggered memory mapped access |
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Method and system for performing built-in-self-test routines using an accumulator to store fault information |
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Method and system for performing built-in self-test routines using an accumulator to store fault information |
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Method for testing semiconductor devices having built-in self repair (BISR) memory |
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Built-in redundancy analysis for memories with row and column repair |
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Multi-condition BISR test mode for memories with redundancy |
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Fast built-in self-repair circuit |
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Built-in self repair circuit with pause for data retention coverage |
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Built-in self-test unit having a reconfigurable data retention test |
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Redundancy analysis for embedded memories with built-in self test and built-in self repair |
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Reconfigurable built-in self test circuit |
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1999-11-09 |
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Data retention weak write circuit and method of using same |
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1998-11-10 |