Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7913125 | BISR mode to test the redundant elements and regular functional memory to avoid test escapes | Ghasi R. Agrawal | 2011-03-22 |
| 7536611 | Hard BISR scheme allowing field repair and usage of reliability controller | Ghasi R. Agrawal, Tuan Phan | 2009-05-19 |
| 7493541 | Method and system for performing built-in-self-test routines using an accumulator to store fault information | Ghasi R. Agrawal, William Schwarz | 2009-02-17 |
| 7260758 | Method and system for performing built-in self-test routines using an accumulator to store fault information | Ghasi R. Agrawal, William Schwarz | 2007-08-21 |
| 7185243 | Testing implementation suitable for built-in self-repair (BISR) memories | Ghasi R. Agrawal, Thompson W. Crosby | 2007-02-27 |
| 7076699 | Method for testing semiconductor devices having built-in self repair (BISR) memory | Ghasi R. Agrawal, William Schwarz | 2006-07-11 |
| 6928598 | Scan method for built-in-self-repair (BISR) | Ghasi R. Agrawal | 2005-08-09 |
| 6898143 | Sharing fuse blocks between memories in hard-BISR | Ghasi R. Agrawal | 2005-05-24 |
| 6871297 | Power-on state machine implementation with a counter to control the scan for products with hard-BISR memories | Ghasi R. Agrawal | 2005-03-22 |
| 6757854 | Detecting faults in dual port FIFO memories | Jun Zhao, V. Swamy Irrinki | 2004-06-29 |
| 6550032 | Detecting interport faults in multiport static memories | Jun Zhao, V. Swamy Irrinki | 2003-04-15 |
| 6496950 | Testing content addressable static memories | Jun Zhao, V. Swamy Irrinki | 2002-12-17 |