| 7536611 |
Hard BISR scheme allowing field repair and usage of reliability controller |
Mukesh K. Puri, Ghasi R. Agrawal |
2009-05-19 |
| 6671842 |
Asynchronous bist for embedded multiport memories |
Thompson W. Crosby, V. Swamy Irrinki |
2003-12-30 |
| 6651202 |
Built-in self repair circuitry utilizing permanent record of defects |
— |
2003-11-18 |
| 6634003 |
Decoding circuit for memories with redundancy |
— |
2003-10-14 |
| 6505313 |
Multi-condition BISR test mode for memories with redundancy |
William Schwarz |
2003-01-07 |
| 6425103 |
Programmable moving inversion sequencer for memory bist address generation |
— |
2002-07-23 |
| 6367042 |
Testing methodology for embedded memories using built-in self repair and identification circuitry |
V. Swamy Irrinki |
2002-04-02 |
| 6300769 |
Fast comparator suitable for BIST and BISR applications |
— |
2001-10-09 |
| 6227637 |
Circuit and method for encoding and retrieving a bit of information |
— |
2001-05-08 |
| 6067262 |
Redundancy analysis for embedded memories with built-in self test and built-in self repair |
V. Swamy Irrinki, William Schwarz |
2000-05-23 |
| 5903505 |
Method of testing memory refresh operations wherein subthreshold leakage current may be set to near worst-case conditions |
Thomas R. Wik, Thien Trieu |
1999-05-11 |
