Issued Patents All Time
Showing 26–50 of 63 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6358819 | Dual gate oxide process for deep submicron ICS | Gail D. Shelton | 2002-03-19 |
| 6328802 | Method and apparatus for determining temperature of a semiconductor wafer during fabrication thereof | Todd A. Randazzo | 2001-12-11 |
| 6319793 | Circuit isolation utilizing MeV implantation | Donald M. Bartlett, Randall Mason | 2001-11-20 |
| 6287987 | Method and apparatus for deposition of porous silica dielectrics | Gail D. Shelton | 2001-09-11 |
| 6277707 | Method of manufacturing semiconductor device having a recessed gate structure | Brian R. Lee, Kunal N. Taravade | 2001-08-21 |
| 6268224 | Method and apparatus for detecting an ion-implanted polishing endpoint layer within a semiconductor wafer | Michael F. Chisholm | 2001-07-31 |
| 6258205 | Endpoint detection method and apparatus which utilize an endpoint polishing layer of catalyst material | Brynne K. Chisholm, Gail D. Shelton | 2001-07-10 |
| 6225215 | Method for enhancing anti-reflective coatings used in photolithography of electronic devices | Kunal N. Taravade, Gail D. Shelton | 2001-05-01 |
| 6206573 | High reliability bearing structure | Gail D. Shelton | 2001-03-27 |
| 6208029 | Integrated circuit device with reduced cross talk | Derryl D. J. Allman, Kenneth P. Fuchs, Samuel C. Gioia | 2001-03-27 |
| 6150175 | Copper contamination control of in-line probe instruments | Gail D. Shelton | 2000-11-21 |
| 6136719 | Method and arrangement for fabricating a semiconductor device | Gail D. Shelton | 2000-10-24 |
| 6130117 | Simple bicmos process for creation of low trigger voltage SCR and zener diode pad protection | John D. Walker, Todd A. Randazzo | 2000-10-10 |
| 6117779 | Endpoint detection method and apparatus which utilize a chelating agent to detect a polishing endpoint | Gail D. Shelton | 2000-09-12 |
| 6090724 | Method for composing a thermally conductive thin film having a low dielectric property | Gail D. Shelton | 2000-07-18 |
| 6080670 | Method of detecting a polishing endpoint layer of a semiconductor wafer which includes a non-reactive reporting specie | Gail D. Shelton, Brynne K. Chisholm | 2000-06-27 |
| 6071818 | Endpoint detection method and apparatus which utilize an endpoint polishing layer of catalyst material | Brynne K. Chisholm, Gail D. Shelton | 2000-06-06 |
| 6063672 | NMOS electrostatic discharge protection device and method for CMOS integrated circuit | Samuel C. Gioia, Todd A. Randazzo | 2000-05-16 |
| 6057571 | High aspect ratio, metal-to-metal, linear capacitor for an integrated circuit | Kenneth P. Fuchs | 2000-05-02 |
| 6011283 | Pillar emitter for BiCMOS devices | Steven S. Lee | 2000-01-04 |
| 5963825 | Method of fabrication of semiconductor fuse with polysilicon plate | Steven S. Lee | 1999-10-05 |
| 5821013 | Variable step height control of lithographic patterning through transmitted light intensity variation | Brian R. Lee | 1998-10-13 |
| 5821572 | Simple BICMOS process for creation of low trigger voltage SCR and zener diode pad protection | John D. Walker, Todd A. Randazzo | 1998-10-13 |
| 5672905 | Semiconductor fuse and method | Steven S. Lee | 1997-09-30 |
| 5581861 | Method for making a solid-state ink jet print head | Steven S. Lee | 1996-12-10 |