GS

Gail D. Shelton

Lsi Logic: 15 patents #92 of 1,957Top 5%
TI Texas Instruments: 9 patents #1,613 of 12,488Top 15%
RTX (Raytheon): 1 patents #8,248 of 15,912Top 55%
📍 Mesquite, TX: #1 of 236 inventorsTop 1%
🗺 Texas: #4,820 of 125,132 inventorsTop 4%
Overall (All Time): #156,443 of 4,157,543Top 4%
26
Patents All Time

Issued Patents All Time

Showing 1–25 of 26 patents

Patent #TitleCo-InventorsDate
6806162 Method for composing a dielectric layer within an interconnect structure of a multilayer semiconductor device Gayle W. Miller 2004-10-19
6614097 Method for composing a dielectric layer within an interconnect structure of a multilayer semiconductor device Gayle W. Miller 2003-09-02
6527867 Method for enhancing anti-reflective coatings used in photolithography of electronic devices Kunal N. Taravade, Gayle W. Miller 2003-03-04
6509520 High strength composite thermoelectric cooler and method for making same Robert J. S. Kyle, Sam McKenney 2003-01-21
6383332 Endpoint detection method and apparatus which utilize a chelating agent to detect a polishing endpoint Gayle W. Miller 2002-05-07
6358819 Dual gate oxide process for deep submicron ICS Gayle W. Miller 2002-03-19
6287987 Method and apparatus for deposition of porous silica dielectrics Gayle W. Miller 2001-09-11
6258205 Endpoint detection method and apparatus which utilize an endpoint polishing layer of catalyst material Brynne K. Chisholm, Gayle W. Miller 2001-07-10
6225215 Method for enhancing anti-reflective coatings used in photolithography of electronic devices Kunal N. Taravade, Gayle W. Miller 2001-05-01
6206573 High reliability bearing structure Gayle W. Miller 2001-03-27
6150175 Copper contamination control of in-line probe instruments Gayle W. Miller 2000-11-21
6136719 Method and arrangement for fabricating a semiconductor device Gayle W. Miller 2000-10-24
6117779 Endpoint detection method and apparatus which utilize a chelating agent to detect a polishing endpoint Gayle W. Miller 2000-09-12
6090724 Method for composing a thermally conductive thin film having a low dielectric property Gayle W. Miller 2000-07-18
6080670 Method of detecting a polishing endpoint layer of a semiconductor wafer which includes a non-reactive reporting specie Gayle W. Miller, Brynne K. Chisholm 2000-06-27
6071818 Endpoint detection method and apparatus which utilize an endpoint polishing layer of catalyst material Brynne K. Chisholm, Gayle W. Miller 2000-06-06
5653851 Method and apparatus for etching titanate with organic acid reagents 1997-08-05
5604977 Method of fabricating focal plane array James Robinson, James F. Belcher, Howard R. Beratan, Steven N. Frank, Charles M. Hanson +5 more 1997-02-25
5578826 Thermal isolation for hybrid thermal detectors William K. Walker, John P. Long, Robert A. Owen, Bert T. Runnels 1996-11-26
5574282 Thermal isolation for hybrid thermal detectors William K. Walker, John P. Long, Robert A. Owen, Bert T. Runnels 1996-11-12
5572059 Thermal isolation of hybrid thermal detectors through an anisotropic etch William K. Walker, Steven N. Frank, Charles M. Hanson, Robert J. S. Kyle, Edward G. Meissner +1 more 1996-11-05
5572029 Thermal isolation for hybrid thermal detectors William K. Walker, John P. Long, Robert A. Owen, Bert T. Runnels 1996-11-05
5478242 Thermal isolation of hybrid thermal detectors through an anisotropic etch William K. Walker, Steven N. Frank, Charles M. Hanson, Robert J. S. Kyle, Edward G. Meissner +1 more 1995-12-26
5457318 Thermal detector apparatus and method using reduced thermal capacity James Robinson, James F. Belcher, Howard R. Beratan, Steven N. Frank, Charles M. Hanson +5 more 1995-10-10
5426303 Thermal isolation structure for hybrid thermal detectors Robert A. Owen, John P. Long, Bert T. Runnels, William K. Walker 1995-06-20