Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9007079 | System and method for compensating measured IDDQ values | Dushyant Narayen, Nerinder Singh, Gunaseelan Ponnuvel, Hemant Kumar, Craig Nishizaki | 2015-04-14 |
| 7542134 | System, method and apparatus for in-situ substrate inspection | Aleksander Owczarz, Jaroslaw W. Winniczek, Alan M. Schoepp, Fred C. Redeker, Erik A. Edelberg | 2009-06-02 |
| 7397555 | System, method and apparatus for in-situ substrate inspection | Aleksander Owczarz, Jaroslaw W. Winniczek, Alan M. Schoepp, Fred C. Redeker, Erik A. Edelberg | 2008-07-08 |