Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9207277 | System and method for generating a yield forecast based on wafer acceptance tests | Peter Hung, Gunaseelan Ponnuvel, Chien-Hsiung Peng | 2015-12-08 |
| 9007079 | System and method for compensating measured IDDQ values | Dushyant Narayen, Nerinder Singh, Gunaseelan Ponnuvel, Hemant Kumar, Luai Nasser | 2015-04-14 |
| 6018686 | Electrically imprinting a semiconductor die with identifying information | William R. Orso | 2000-01-25 |