Issued Patents All Time
Showing 26–50 of 74 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9147673 | Semiconductor power converter and method of manufacturing the same | Hideo Nishiuchi, Takayuki Masunaga, Naotake Watanabe, Yoshiyuki Shimizu, Takashi Togasaki +1 more | 2015-09-29 |
| 9091038 | Construction machine | Tomoyuki Tsuchihashi, Masaru Numasawa | 2015-07-28 |
| 9027676 | Construction machine | Hajime Nakashima, Masaru Numasawa, Zenzo Yamaguchi, Yasumasa Kimura | 2015-05-12 |
| 8872327 | Semiconductor device | Takayuki Masunaga, Naotake Watanabe, Yoshiyuki Shimizu, Hideo Nishiuchi, Takashi Togasaki +1 more | 2014-10-28 |
| 8795042 | Defroster nozzle | Tadahiro Matsumoto, Takehiko Iwamura | 2014-08-05 |
| D701537 | Compressor or vacuum machine | Eiji Okada | 2014-03-25 |
| 8672073 | Construction machine | Tomoyuki Tsuchihashi | 2014-03-18 |
| D700216 | Combined compressor and vacuum machine | — | 2014-02-25 |
| D700215 | Combined compressor and vacuum machine | — | 2014-02-25 |
| 8590668 | Construction machine with cab noise reduction device | Kyoko Masuda, Yasumasa Kimura | 2013-11-26 |
| 8493762 | Power semiconductor module and semiconductor power converter provided with the same | Gou Ninomiya, Toshiharu Obu, Yoshiyuki Shimizu, Shinichi Baba | 2013-07-23 |
| 8384030 | Method and apparatus for setting sample observation condition, and method and apparatus for sample observation | Tatsuya Maeda | 2013-02-26 |
| 8188427 | Scanning electron microscope alignment method and scanning electron microscope | Junichi Kakuta, Tatsuya Maeda, Hiroyuki Saito, Katsuhiro Sasada | 2012-05-29 |
| 7928376 | Element mapping unit, scanning transmission electron microscope, and element mapping method | Kazutoshi Kaji, Koji Kimoto, Takashi Aoyama, Shunroku Taya, Shigeto Isakozawa | 2011-04-19 |
| 7875251 | Ozone-decomposing agent | — | 2011-01-25 |
| 7859799 | Magnetoresistive head and a manufacturing method thereof | Katsuro Watanabe, Taku Shintani, Masahiro Osugi | 2010-12-28 |
| 7751527 | Measurement method of layer thickness for thin film stacks | Akio Yoneyama | 2010-07-06 |
| 7724872 | Inspection method for thin film stack | — | 2010-05-25 |
| 7501853 | Data processing circuit | — | 2009-03-10 |
| 7451843 | Construction machine | Hajime Nakashima, Yasumasa Kimura, Hideo Utsuno, Toshiyuki Kobayashi | 2008-11-18 |
| 7364607 | Wrought fiber sheet and filter unit | Toyota Seki | 2008-04-29 |
| 7134518 | Construction machine | Seigo Arai, Takashi Tsukiana, Koichi Yamashita, Hiroaki Iwamitsu | 2006-11-14 |
| 7131422 | Construction machine | Yasumasa Kimura, Hajime Nakashima | 2006-11-07 |
| 7053371 | Scanning electron microscope with measurement function | Yuuki Ojima, Katsuhiro Sasada, Tsuyoshi Morimoto | 2006-05-30 |
| 6998943 | High-frequency power amplifier | Akira Ohta, Akira Inoue | 2006-02-14 |