Issued Patents All Time
Showing 26–33 of 33 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5640238 | Method of inspecting particles on wafers | Masami Nakano, Isao Uchiyama, Morie Suzuki | 1997-06-17 |
| 5626681 | Method of cleaning semiconductor wafers | Masami Nakano, Isao Uchiyama | 1997-05-06 |
| 5623143 | Photo sensor having sectioned lens | — | 1997-04-22 |
| 5619326 | Method of sample valuation based on the measurement of photothermal displacement | Tsutomu Morimoto, Shingo Sumie, Naoyuki Yoshida | 1997-04-08 |
| 5591966 | Photosensor package with defined locations for lens supporting lead | Yoshio Harada, Toshiyasu Shimada, Takanori Yamashita | 1997-01-07 |
| D367848 | Module for receiving infra-red signal of remote controller | Yoshio Harada, Toshiyasu Shimada, Takanori Yamashita | 1996-03-12 |
| 5298970 | Sample evaluating method by using thermal expansion displacement | Yoshiro Nishimoto, Shingo Sumie | 1994-03-29 |
| 4874939 | Method and apparatus for detecting position/variance of input light using linear and quadratic outputs | Yoshiro Nishimoto, Yasuji Yoneda, Shinichi Imaoka, Yasuhide Nakai, Akimitsu Nakaue +7 more | 1989-10-17 |